MBE growth and characterization of dilute nitrides for mid-infrared optoelectronic devices

MBE growth and characterization of dilute nitrides for mid-infrared optoelectronic devices
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中红外光电器件稀氮化物的 MBE 生长和表征

DOI:
10.1117/12.872759
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发表时间:
2011
期刊:
--
影响因子:
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通讯作者:
De La Mare M
De La Mare M
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作者:
De La Mare M

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我们报告了使用氮等离子体源在 GaAs 衬底上窄间隙稀氮化物 InAsN 合金的分子束外延生长。描述了 N 含量在 0 至 1% 范围内的 InAsN 合金的光致发光 (PL),其在中红外光谱范围内表现出发射。含有 1% N 的样品揭示了 InAsN 简并导带内扩展态和局域态重组的证据。 GaAs 和 InAs 基材料的比较表明 PL 线宽几乎没有变化,因此衬底的变化不会导致外延层质量的显着下降。带隙对材料中氮含量的依赖性与能带反交叉模型的预测一致。我们还报告了 InAsSbN/InAs 多量子阱的生长,其在高达 250 K 的温度下表现出明亮的 PL,无需任何后生长退火。对功率相关 PL 行为的考虑与 I 型能带排列一致,该排列是由于 N 引起的能带反交叉效应导致导带边缘强烈降低而产生的。
We report the molecular beam epitaxial growth of narrow gap dilute nitride InAsN alloys onto GaAs substrates using a nitrogen plasma source. The photoluminescence (PL) of InAsN alloys with N-content in the range 0 to 1% which exhibit emission in the mid-infrared spectral range is described. The sample containing 1% N reveals evidence of recombination from extended and localized states within the degenerate conduction band of InAsN. A comparison of GaAs and InAs based material shows little change in PL linewidth such that the change in substrate does not cause significant reduction in quality of the epilayers. The band gap dependence on N content in our material is consistent with predictions from the band anti-crossing model. We also report the growth of InAsSbN/InAs multi-quantum wells which exhibit bright PL up to a temperature of 250 K without any post growth annealing. Consideration of the power dependent PL behaviour is consistent with Type I band alignment arising from strong lowering of the conduction band edge due to N-induced band anti-crossing effects.
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