Design of compensation pixel circuit with In-Zn-O thin film transistor for active-matrix organic light-emitting diode 3D display
Design of compensation pixel circuit with In-Zn-O thin film transistor for active-matrix organic light-emitting diode 3D display
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用于有源矩阵有机发光二极管3D显示的In-Zn-O薄膜晶体管补偿像素电路设计
DOI：
10.1007/s12200-016-0562-y
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发表时间：
2017-03
影响因子：
5.4
通讯作者：
Wu Weijing
中科院分区：
文献类型：
--
作者：
Hu Xiao;Xia Xingheng;Zhou Lei;Zhang Lirong;Wu Weijing
提出了一种适用于有源矩阵有机发光二极管（AMOLED）立体三维（3D）显示器的新型补偿像素电路。采用同时发射的方法解决了串扰问题，即初始化和阈值电压检测同时发生在整个面板的每个像素上。此外，通过采用阈值电压一次检测方法，不需要从第二帧开始的初始化和阈值电压检测周期。所提出的像素电路的非均匀性是相当低的，从20个由In-Zn-O薄膜晶体管（IZO TFT）集成的离散的所提出的像素电路测量的平均值为8.6%。结果表明，即使阈值电压检测周期仅存在于第一帧中，OLED电流对于高达70帧的数目几乎保持恒定。
This paper presents a new compensation pixel circuit suitable for active-matrix organic light-emitting diode (AMOLED) stereoscopic three dimensional (3D) displays with shutter glasses. The simultaneous emission method was used to solve the crosstalk problem, in which the periods of initialization and threshold voltage detection occur for each pixel of whole panel simultaneously. Furthermore, there was no need of the periods of initialization and threshold voltage detection from the second frame beginning by employing threshold voltage one-time detection method. The non-uniformity of the proposed pixel circuit was considerably low with an average value of 8.6% measured from 20 discrete proposed pixel circuits integrated by In-Zn-O thin film transistors (IZO TFTs). It was shown that the OLED current almost remains constant for the number of frames up to 70 even the threshold voltage detection period only exists in the first frame.
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采用阈值电压一次性检测方法的 AMOLED 显示器的高速电压编程像素电路
影响因子：
4.9
作者：
Wu, Wei-Jing;Xia, Xing-Heng;Li, Guan-Ming;Zhou, Lei;Zhang, Li-Rong;Yao, Ruo-He;Peng, Jun-Biao
通讯作者：
Peng, Jun-Biao
影响因子：
4.9
作者：
Lin, Chih-Lung;Chang, Wen-Yen;Tu, Chun-Da
通讯作者：
Tu, Chun-Da
DOI：
10.1889/1.3621320
发表时间：
2011-06
期刊：
SID Symposium Digest of Technical Papers
影响因子：
--
作者：
Joong-Sun Yoon;Ji-Min Lee;Hyunhaeng Lee;Young-Hak Lee;Du-Hwan Oh;Tae‐Gung Kim;Kilhwan Oh;Bumsik Kim
通讯作者：
Joong-Sun Yoon;Ji-Min Lee;Hyunhaeng Lee;Young-Hak Lee;Du-Hwan Oh;Tae‐Gung Kim;Kilhwan Oh;Bumsik Kim
影响因子：
4.9
作者：
Jae-Hoon Lee;J. H. Kim;M. Han
通讯作者：
Jae-Hoon Lee;J. H. Kim;M. Han
影响因子：
4.9
作者：
Young-Cheol Lee;S. Bae;S. Fonash
通讯作者：
Young-Cheol Lee;S. Bae;S. Fonash