Melt-grown large-sized Cs2TeI6 crystals for X-ray detection

Melt-grown large-sized Cs2TeI6 crystals for X-ray detection
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用于 X 射线检测的熔体生长大尺寸 Cs2TeI6 晶体

DOI:
10.1039/d0ce00868k
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发表时间:
2020-08
期刊:
影响因子:
3.1
通讯作者:
Xu Yadong
Xu Yadong
中科院分区:
化学3区
文献类型:
--
作者:
Xiao Bao;Wang Fangbao;Xu Meng;Liu Xin;Sun Qihao;Zhang Bin-Bin;Jie Wanqi;Sellin Paul;Xu Yadong

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在这里,我们报告的无铅钙钛矿衍生物Cs2 TeI 6晶体的合成和晶体生长的细节,这揭示了长期的环境稳定性。优化合成工艺以获得纯Cs2 TeI 6多晶,并消除由高蒸气压导致的残余CsI的形成。采用垂直布里奇曼法生长了尺寸为Φ10 mm × 55 mm的Cs2 TeI 6单晶。生长的0-D结构Cs2 TeI 6晶体表现出9.92 × 1011 Ω cm的高电阻率,电子和空穴的迁移率分别为4.03 ± 0.33 cm 2 V−1 s−1和9.40 ± 0.45 cm 2 V−1 s−1。Au/Cs2 TeI 6/Au器件显示出良好的光电和X射线检测响应,具有相对较高的X射线灵敏度,为27.8 μC戈伊−1 cm−2,检测限低,为72.5 n戈伊s−1。
Herein, we report the details of the synthesis and crystal growth of a lead-free perovskite derivative Cs2TeI6 crystal, which reveals long-term environmental stability. The synthesis process is optimized to obtain pure Cs2TeI6 polycrystals, and to eliminate the formation of residual CsI resulting from high vapor pressure. Subsequently, the Cs2TeI6 single crystal with dimensions of Φ10 mm × 55 mm is grown by the vertical Bridgman method. The as-grown 0-D structural Cs2TeI6 crystal exhibits a high resistivity of 9.92 × 1011 Ω cm, and resulting mobilities of 4.03 ± 0.33 cm2 V−1 s−1 and 9.40 ± 0.45 cm2 V−1 s−1 for electrons and holes, respectively. The Au/Cs2TeI6/Au device shows a good response for optoelectronic and X-ray detection, with a relatively high X-ray sensitivity of 27.8 μC Gy−1 cm−2 and a low detection limit of 72.5 nGy s−1.
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