Ion mobility-mass spectrometry: time-dispersive instrumentation.
Ion mobility-mass spectrometry: time-dispersive instrumentation.
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DOI：
10.1021/ac504720m
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发表时间：
2015-02-03
影响因子：
7.4
通讯作者：
McLean, John A.
中科院分区：
文献类型：
--
作者：
May, Jody C.;McLean, John A.
近年来，离子迁移率质谱（IM-MS）领域在基础性进展和开创性应用方面都取得了显著的发展势头。检索术语“离子迁移率”和“质谱”返回2000多篇论文，其中一半以上是在过去4年中发表的（图1，左）。这种兴趣的增加在很大程度上是由于改进的技术，使当代IM-MS能够以高灵敏度，分辨率和样品通量对生物学和医学中的各种样品进行分析。该领域历史发展的亮点如图1所示。离子迁移率和质谱法的基础可以追溯到19世纪末汤姆森和卢瑟福的X射线实验，廷德尔在20世纪30年代左右对离子迁移率的分析能力进行了重大改进。2，3在发现的早期，各种离子迁移率实验参数
The field of ion mobility-mass spectrometry (IM-MS) has grown with significant momentum in recent years in both fundamental advances and pioneering applications. A search of the terms “ion mobility” and “mass spectrometry” returns more than 2 000 papers, with over half of these being published in the past 4 years (Figure 1, left). This increased interest has been motivated in large part by improved technologies which have enabled contemporary IM-MS to be amendable to a variety of samples in biology and medicine with high sensitivity, resolving power, and sample throughput.Highlights of the historical development of the field are presented in Figure 1, right. Ion mobility and mass spectrometry trace their foundations to the X-ray experiments of Thomson and Rutherford in the late 1800s, 1 with Tyndall making significant improvements in the analytical capabilities of ion mobility around the 1930s. 2, 3 During this early era of discovery, a variety of ion mobility experimental parameters
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影响因子：
4.4
作者：
BOHRINGER, H;ARNOLD, F
通讯作者：
ARNOLD, F
DOI：
10.1016/0168-1176(93)87062-w
发表时间：
1993-10-29
期刊：
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES
影响因子：
--
作者：
BURYAKOV, IA;KRYLOV, EV;RASULEV, UK
通讯作者：
RASULEV, UK
DOI：
10.1016/1044-0305(94)85033-x
发表时间：
1994-03-01
影响因子：
3.2
作者：
CODY, RB;TAMURA, J;MUSSELMAN, BD
通讯作者：
MUSSELMAN, BD
影响因子：
1.8
作者：
Berezovskaya, Yana;Porrini, Massimiliano;Barran, Perdita E.
通讯作者：
Barran, Perdita E.
影响因子：
7.4
作者：
Clowers, Brian H.;Ibrahim, Yehia M.;Smith, Richard D.
通讯作者：
Smith, Richard D.