3D piezoresistive silicon microprobes with stacked suspensions for tailored mechanical anisotropies

3D piezoresistive silicon microprobes with stacked suspensions for tailored mechanical anisotropies
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具有堆叠式悬架的 3D 压阻硅微探针,可实现定制的机械各向异性

DOI:
10.1016/j.sna.2017.09.039
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发表时间:
2017
影响因子:
4.6
通讯作者:
D. Metz
D. Metz
中科院分区:
工程技术3区
文献类型:
--
作者:
D. Metz

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为了实现高精度的测量,人们开发了不同种类的硅基压阻式微探头。然而,这种系统的典型力学各向异性导致了在探测倾斜表面时尖端的滑移。在这里,提出了一种新的微探针设计,它可以被定制以提供一定范围的各向异性甚至完美的各向同性。在第一种方法中,微探针由两层堆叠的硅膜组成。在第二种方法中,将激光结构箔形式的不锈钢悬浮液堆叠在硅膜上。通过力学有限元模拟进行了几何参数研究,以确定它们对所有空间方向的刚度的影响,并预测各向异性。制备了具有选定几何结构的微系统,并通过晶片级别的选择性粘接转移和键合获得了堆积。各向异性在3到0.4之间的原型被表征,证实了模拟结果。
Different kinds of piezoresistive microprobes based on silicon have been developed to enable measurement with high accuracies. However, the typical mechanical anisotropy of such systems leads to the slip of the tip, when probing inclined surfaces. Here, a novel microprobe design is presented, which can be tailored to provide a range of anisotropy or even a perfect isotropy. In the first approach, the microprobe is composed of two stacked silicon membranes. In the second approach, a stainless steel suspension in the form of a laser structured foil is stacked on a silicon membrane. Geometrical parameter studies were carried out by mechanical FEM simulations to determine their influence on the stiffnesses in all spatial directions and to predict anisotropies. Microsystems with selected geometries were fabricated and stacking was obtained through selective adhesive transfer and bonding on a wafer level. Prototypes with anisotropies between 3 and 0.4 were characterized confirming the simulations.
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