Area-efficient reconfigurable ring oscillator for device and circuit level characterization of static and dynamic variations

Area-efficient reconfigurable ring oscillator for device and circuit level characterization of static and dynamic variations
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面积高效的可重构环形振荡器,用于静态和动态变化的器件和电路级表征

DOI:
10.7567/jjap.53.04ee08
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发表时间:
2014
影响因子:
1.5
通讯作者:
H. Onodera
H. Onodera
中科院分区:
物理与天体物理4区
文献类型:
--
作者:
A. Islam;H. Onodera

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准确描述晶体管在动态开关条件下的变化对于可靠的数字电路设计具有重要意义。提出了一种能够测量晶体管电平变化的可重构环形振荡器(RO)结构。RO中的每个逆变级可以配置为几种延迟模式。通过配置非均匀反相结构,可以使特定反相级的延迟占主导地位。通过扫描非均匀级,可以测量每一级的时延变化。此外,pMOSFET和nMOSFET的变化可以通过仅使上升或下降延迟占主导地位来分别测量。通过对非均质级的重构,可以识别出非均质级中含有随机电报噪声(RTN)的特定晶体管。因此,使用单个RO,可以测量静态时延变化以及诸如RTN的动态变化。包括外围电路在内的127级可重构RO的面积仅为0.0085平方毫米,因此面积效率测量成为可能。65 nm测试芯片的测试结果表明了该电路结构的有效性。
Accurate characterization of transistor variation under dynamic switching condition has become important for reliable digital circuit design. This paper proposes a reconfigurable ring oscillator (RO) structure which enables measurement of transistor level variation. Each inverter stage in the RO can be configured into several delay modes. The delay of a particular inverting stage can be made dominant by configuring an inhomogeneous RO structure. By scanning the inhomogeneous stage, delay variation of each stage can be measured. Furthermore, pMOSFET and nMOSFET variation can be measured separately by making only rise or fall delay dominant. Specific transistor with random telegraph noise (RTN) in the inhomogeneous stage can be identified by reconfiguring the inhomogeneous stage. Thus, using a single RO, static delay variation as well as dynamic variation such as RTN can be measured. The area for a 127-staged reconfigurable RO including peripheral circuits is only 0.0085 mm2 thus area-efficient measurement becomes possible. Measurement results from a 65-nm test chip shows the validity of the proposed circuit structure.
DOI: --
发表时间: 2011
期刊:
影响因子: --
作者:
伊東;松本;西澤;砂川;小林;小野寺
通讯作者: 小野寺
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DOI: 10.1587/transinf.e96.d.1971
发表时间: 2013
影响因子: 0.7
作者:
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通讯作者: and Hidetoshi Onodera