Measurement of Random Surface Parameters by Angle-Resolved In-plane Light Scattering with Constant Perpendicular Wave Vector

Measurement of Random Surface Parameters by Angle-Resolved In-plane Light Scattering with Constant Perpendicular Wave Vector
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恒定垂直波矢角分辨面内光散射测量随机表面参数

DOI:
10.1088/0256-307x/28/2/024206
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发表时间:
2011-02
影响因子:
3.5
通讯作者:
Cheng Chuan-Fu
Cheng Chuan-Fu
中科院分区:
物理与天体物理3区
文献类型:
--
作者:
Li Hai-Xia;Liu Chun-Xiang;Chen Xiao-Yi;Zhang Mei-Na;Cheng Chuan-Fu

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本文报道了利用角分辨面内光散射提取随机表面参数的实验方法。在测量一定入射角下的散射光强剖面时,波矢的垂直分量保持不变,这是通过控制探测器沿着指定圆弧段移动来实现的。利用散射光强分布的中心δ峰和半宽及其变化,得到了粗糙表面样品的粗糙度w、横向相关长度ε和粗糙度指数α。该测量严格按照理论分析进行,克服了以往面内光散射实验中存在的波矢垂直分量变化影响散射光强分布半宽度和测量精度的固有问题。
We report the experimental method of angle-resolved in-plane light scattering for random surface parameter extraction. In the measurement of the scattered intensity profile at a certain angle of incidence, the perpendicular component of wave vector remains constant, which is realized by controlling the movement of the detector along a specified circular arc segment. We use the central δ-peak and the half-width of the diffused intensity profiles and their variations to obtain the roughness w, the lateral correlation length ξ and roughness exponent α of the rough surface sample. The measurement copes strictly with the theoretical analysis, and the inherent problem in previous in-plane light scattering experiment is overcome so that the changes of the perpendicular component of wave vector affect the half width a diffused intensity profile and the measurement accuracy.
DOI: 10.1103/physrevb.47.3911
发表时间: 1993-02
期刊: Physical review. B, Condensed matter
影响因子: --
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