Measurement of Random Surface Parameters by Angle-Resolved In-plane Light Scattering with Constant Perpendicular Wave Vector
Measurement of Random Surface Parameters by Angle-Resolved In-plane Light Scattering with Constant Perpendicular Wave Vector
复制标题
恒定垂直波矢角分辨面内光散射测量随机表面参数
DOI:
10.1088/0256-307x/28/2/024206
复制
发表时间:
2011-02
影响因子:
3.5
通讯作者:
Cheng Chuan-Fu
中科院分区:
文献类型:
--
作者:
Li Hai-Xia;Liu Chun-Xiang;Chen Xiao-Yi;Zhang Mei-Na;Cheng Chuan-Fu
We report the experimental method of angle-resolved in-plane light scattering for random surface parameter extraction. In the measurement of the scattered intensity profile at a certain angle of incidence, the perpendicular component of wave vector remains constant, which is realized by controlling the movement of the detector along a specified circular arc segment. We use the central δ-peak and the half-width of the diffused intensity profiles and their variations to obtain the roughness w, the lateral correlation length ξ and roughness exponent α of the rough surface sample. The measurement copes strictly with the theoretical analysis, and the inherent problem in previous in-plane light scattering experiment is overcome so that the changes of the perpendicular component of wave vector affect the half width a diffused intensity profile and the measurement accuracy.
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DOI:
10.1103/physrevb.47.3911
发表时间:
1993-02
期刊:
Physical review. B, Condensed matter
影响因子:
--
作者:
Yang;Lǔ;Wang
通讯作者:
Yang;Lǔ;Wang
DOI:
10.1103/physreve.65.061104
发表时间:
2002-06
期刊:
Physical review. E, Statistical, nonlinear, and soft matter physics
影响因子:
--
作者:
Chuan-fu Cheng;Chunxiang Liu;Shuyun Teng;Ningyu Zhang;Man Liu
通讯作者:
Chuan-fu Cheng;Chunxiang Liu;Shuyun Teng;Ningyu Zhang;Man Liu
影响因子:
5.5
作者:
K. Liou;Y. Takano
通讯作者:
K. Liou;Y. Takano
DOI:
10.1117/12.279240
发表时间:
1997-09
期刊:
--
影响因子:
--
作者:
T. Germer;C. Asmail
通讯作者:
T. Germer;C. Asmail
影响因子:
3.2
作者:
Yiping Zhao;Irene C. Wu;C.-F. Cheng;U. Block;Gwo-Ching Wang;T. Lu
通讯作者:
Yiping Zhao;Irene C. Wu;C.-F. Cheng;U. Block;Gwo-Ching Wang;T. Lu