An overview of continuous and discrete phasor analysis of binned or time-gated periodic decays

An overview of continuous and discrete phasor analysis of binned or time-gated periodic decays
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分箱或时间选通周期性衰减的连续和离散相量分析概述

DOI:
10.1117/12.2577747
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发表时间:
2021
期刊:
SPIE
影响因子:
--
通讯作者:
Michalet, Xavier
Michalet, Xavier
中科院分区:
--
文献类型:
--
作者:
Michalet, Xavier

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在时间选通或分箱的存在下,通过相量方法重新审视周期性激发的发光衰减的时间分辨分析。离散配置的方形门的解析表达式推导和轨迹的相量的这种修改的周期性的单指数衰减相比,典型的通用的周期。文中还讨论了IRF偏移、衰减截断和门形状的影响。最后,修正的相位和模量寿命的表达式提供了一些简单的情况下。讨论了一种改进的相量校准方法。
Time-resolved analysis of periodically excited luminescence decays by the phasor method in the presence of time-gating or binning is revisited. Analytical expressions for discrete configurations of square gates are derived and the locus of the phasors of such modified periodic single-exponential decays is compared to the canonical universal semicircle. The effects of IRF offset, decay truncation and gate shape are also discussed. Finally, modified expressions for the phase and modulus lifetimes are provided for some simple cases. A discussion of a modified phasor calibration approach is presented.
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