Assessment of strain hardening in copper single crystals using in situ SEM microshear experiments
Assessment of strain hardening in copper single crystals using in situ SEM microshear experiments
复制标题
使用原位 SEM 微剪切实验评估铜单晶的应变硬化
DOI:
10.1016/j.actamat.2016.04.055
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发表时间:
2016
期刊:
影响因子:
9.4
通讯作者:
G. Eggeler
中科院分区:
文献类型:
--
作者:
N. Wieczorek;G. Laplanche;J.-K. Heyer;A.B. Parsa;J. Pfetzing-Micklich;G. Eggeler
The effect of a pre-strain on the plasticity of copper single crystals subjected to in situ microshear deformation in a scanning electron microscope (SEM) is investigated. Pre-strains of 6.5 and 20% are imposed using [1 0 0] tensile testing. During tensile pre-deformation, several slip systems are activated and irregularly spaced slip bands form. A trace analysis revealed the presence of several slip bands on the tensile specimen near the grips while one family of slip bands parallel to the (1 1 1) crystallographic plane were detected in the middle of the tensile specimen. From the middle of the pre-deformed tensile specimens double microshear samples were prepared using focused ion beam (FIB) machining such that the [0 -1 -1] (1 -1 1) slip system could be directly activated. The results show how microshear behavior reacts to different levels of tensile pre-deformation. Sudden deformation events (SDEs) are observed during microshear testing. The critical stress associated with the first SDE is shown to increase with increasing pre-deformation as a result of an increasing number of slip bands introduced during pre-deformation per shear zone. The results allow also to obtain information on the interaction between dislocations activated during microshearing ([0 -1 -1] (1 -1 1)) and those which were introduced during tensile pre-deformation ([1 0 -1] (1 1 1) and [1 -1 0] (1 1 1)). When these slip systems interact glissile junctions and Lomer-Cottrell locks are likely to form. In the light of this analysis, we rationalize the occurrence of sudden deformation events based on piled up dislocation assemblies which overcome Lomer-Cottrell lock barriers.
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影响因子:
5.3
作者:
Dequiedt, J. L.;Denoual, C.;Madec, R.
通讯作者:
Madec, R.
DOI:
--
发表时间:
1977
期刊:
影响因子:
--
作者:
U. Alpen;J. Doukhan
通讯作者:
J. Doukhan
DOI:
--
发表时间:
2000
期刊:
影响因子:
--
作者:
H. Alexander;J. L. Crawford
通讯作者:
J. L. Crawford
影响因子:
9.4
作者:
C. Kirchlechner;P. Imrich;W. Grosinger;M. Kapp;J. Keckes;J. Micha;O. Ulrich;O. Thomas;S. Labat;C. Motz;G. Dehm
通讯作者:
G. Dehm
影响因子:
0.8
作者:
Kiener, Daniel;Motz, Christian;Pippan, Reinhard
通讯作者:
Pippan, Reinhard