Near-Edge X-ray Absorption Fine-Structure Spectroscopic Study on Nitrogen-Doped Ultrananocrystalline Diamond/Hydrogenated Amorphous Carbon Composite Films Prepared by Pulsed Laser Deposition
Near-Edge X-ray Absorption Fine-Structure Spectroscopic Study on Nitrogen-Doped Ultrananocrystalline Diamond/Hydrogenated Amorphous Carbon Composite Films Prepared by Pulsed Laser Deposition
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脉冲激光沉积制备氮掺杂超纳米晶金刚石/氢化非晶碳复合薄膜的近边X射线吸收细结构光谱研究
DOI：
10.1143/jjap.50.08jd05
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发表时间：
2011
影响因子：
1.5
通讯作者：
Tsuyoshi Yoshitake
中科院分区：
文献类型：
--
作者：
Sausan Al-Riyami;Shinya Ohmagari;Tsuyoshi Yoshitake
采用脉冲激光沉积法制备了具有n型导电特性的掺氮超纳米金刚石（UNCD）/氢化非晶碳（aC：H）复合薄膜。掺杂有7.9原子%的氮含量的膜在300 K时电导率为18 Ω-1· cm-1。近边X射线吸收精细结构（NEXAFS）测量表明，与未掺杂的薄膜相比，由于π* C= N，σ* C= N和σ* C-N键的存在，薄膜中出现了额外的峰.从NEXAFS谱估计的sp2键分数增加的氮含量。电导率的提高可能是由于形成了额外的π* 和σ* 态以及sp2成键分数的提高。
Nitrogen-doped ultrananocrystalline diamond (UNCD)/hydrogenated amorphous carbon (aC: H) composite films, which possessed n-type conduction with enhanced electrical conductivity, were prepared by pulsed laser deposition. The film doped with a nitrogen content of 7.9 at.% possessed enhanced electrical conductivity of 18 Ω-1· cm-1 at 300 K. The near-edge X-ray absorption fine-structure (NEXAFS) measurement indicated the appearance of additional peaks due to π* C= N, σ* C= N, and σ* C–N bonds compared with the spectra of undoped films. The sp 2 bonding fraction estimated from the NEXAFS spectra increased with the nitrogen content. The enhanced electrical conductivity is probably due to the formation of additional π* and σ* states and the enhancement in the sp 2 bonding fraction.
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影响因子：
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作者：
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作者：
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DOI：
--
发表时间：
2006
期刊：
Proc. of The 8th Cross Straits Symposium on Materials, Energy and Environment Sciences
影响因子：
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作者：
Akira NAGANO;Tsuyoshi YOSHITAKE;Masaru TAKURA;Noriyuki KUWANO;Takeshi HARA;Kunihito NAGAYAMA
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