Algorithmic Aspects of VLSI

这项研究研究了一些算法的问题， 超大规模集成电路芯片和晶片的设计。 最重要的利益是问题 容错处理器阵列的有效设计。 下 首先是如何使详尽的 VLSI自测试方法。 第三个持续关注的领域是 多层电路实现，其中注意力正在从 抽象的布局理论问题到CAD算法问题。 一个新领域 感兴趣的包括算法（相对于面向系统） “硅编译”问题的各个方面。 所有这些主题 包括从抽象的数学问题到 具体的工程问题。 目的是解决问题， 沿着这个抽象到具体的光谱的几个点。

This research studies a number of algorithmic issues related to the design of VLSI chips and wafers. The foremost interest is the problem of the efficient design of fault-tolerant arrays of processors. Next in priority is the problem of how to render feasible the exhaustive test approach to VLSI self-test. A third continuing area of concern is multilayer circuit realizations, where the attention is shifting from abstract layout-theoretic issues to CAD-algorithmic ones. A new area of interest includes algorithmic (in contrast to systems-oriented) aspects of the "silicon compilation" problem. All of these topics encompass problems ranging from abstract mathematical questions to concrete engineering issues. The intent is to tackle the problems at several points along this abstract-to-concrete spectrum.