Algorithmic Aspects of VLSI

这项研究研究了与VLSI芯片和晶片设计相关的一些算法问题。最令人感兴趣的是处理器容错阵列的有效设计问题。下一个优先考虑的问题是如何使VLSI自测试的穷举测试方法可行。第三个持续关注的领域是多层电路实现，其中的注意力正从抽象的布局理论问题转移到CAD算法问题上。一个新的感兴趣的领域包括“硅编译”问题的算法方面(相对于面向系统的问题)。所有这些主题都涵盖了从抽象数学问题到具体工程问题的各种问题。其目的是在这个从抽象到具体的光谱中的几个点上解决问题。

This research studies a number of algorithmic issues related to the design of VLSI chips and wafers. The foremost interest is the problem of the efficient design of fault-tolerant arrays of processors. Next in priority is the problem of how to render feasible the exhaustive test approach to VLSI self-test. A third continuing area of concern is multilayer circuit realizations, where the attention is shifting from abstract layout-theoretic issues to CAD-algorithmic ones. A new area of interest includes algorithmic (in contrast to systems-oriented) aspects of the "silicon compilation" problem. All of these topics encompass problems ranging from abstract mathematical questions to concrete engineering issues. The intent is to tackle the problems at several points along this abstract-to-concrete spectrum.