Engineering Research Equipment Grant: Impedance and NetworkCharacterization System

从这笔赠款购买的设备将作为一个 通用计算机控制采集系统。 系统 将能够测量导纳和网络参数 各种器件，如二极管，MOS电容器，双极和MOS 晶体管、电感器等。采集系统将支持 主要在半导体领域的研究项目数量 装置. 这些项目的例子包括调查 半导体中的重掺杂效应和模型的发展 用于双极和MOS器件的计算机辅助设计。

The equipment purchased from this grant will serve as a part of a general purpose computer-controlled acquisition system. The system will be capable of measuring both the admittance and network parameters of various devices, such as diodes, MOS capacitors, bipolar and MOS transistors, inductors, etc. The acquisition system will support a number of research projects primarily in the area of semiconductor devices. The examples of the projects include the investigation of heavy-doping effects in semiconductors and the development of models for computer-aided design of bipolar and MOS devices.