Engineering Research Equipment Grant: A General Purpose Electro-Optic Sampling Station

该设备项目将提供电子设备和电路先进研究所需的最先进的仪器；它将用于建立一个通用的电光采样站。空间站将允许对设备和电路进行非侵入性光学探测。电光采样是对电路或微带传输线上的电压进行非侵入性测量的一种强大技术。还将开展对该技术的扩展和限制的工作。该站将为伯克利的毫米波(毫米波)集成电路、高速砷化镓器件和电路以及光调制器和探测器领域的正在进行的研究方案提供支持并从中受益。

This equipment project will provide state-of-the-science instrumentation needed for advanced research in electronic devices and circuits; it will be used to establish a general purpose electro-optic sampling station. The station will allow non-invasive optical probing of devices and circuits. Electro-optic sampling is a powerful technique for making non-invasive measurements of voltages on circuits or microstrip transmission lines. Work on extensions to, and on the limits of this technique will also be performed. This station will provide support for and benefit from ongoing research programs in the areas of millimeter-wave (mm-wave) integrated circuits, high speed GaAs devices and circuits, and optical modulators and detectors at Berkeley.