Acquisition of a Time-of-Flight Secondary Ion Mass Spectrometer for the Garcia Center Consortium

皇后学院将获得一台飞行时间二次离子质谱仪（TOF-SIMS）。该仪器将成为工程界面聚合物中心的一个组成部分，该中心是一个材料研究科学与工程中心，包括纽约地区的几个机构。TOF-SIMS将用于研究聚合物薄膜现象，包括深度组成剖面、脱湿和定制表面的spinodal分解。它也将成为该中心本科生研究和高中推广项目的一部分。该仪器将大大提高中心的研究能力和教育计划。＊＊＊

9724553 Schwarz A time-of-flight secondary ion mass spectrometer (TOF-SIMS) will be acquired by Queens College. The instrument will be a component of the Center for Polymers at Engineered Interfaces, a Materials Research Science and Engineering Center encompassing several institutions in the New York City area. The TOF-SIMS will be used for studying polymer film phenomena, including depth composition profiles, dewetting and spinodal decomposition of tailored surfaces. It will also be a part of the Center's undergraduate research and high school outreach programs. %%% The instrument will significantly enhance the Center's research capabilities and its education programs. ***