Non-Contact Pencil Probe for Advanced Manufacturing Inspection

这一建议旨在最终发展一个高 精确的微型探头，能够检查制造的零件， 复杂的几何形状 一种新型的基于激光的非接触式检测 将采用一种技术，该设备被称为非接触式铅笔 由于其设计的形状和尺寸。 光学系统 分为两个子系统，即照明和观察 子系统 将使用三角测量方法。 常规光学 组件不太适合笔式探头，因为它们 大的相对尺寸。 完全不同的光学技术是 为实现所提出的目标。 梯度折射率（GRIN） lens计划 GRIN透镜的光学性能与传统的 但具有恒定厚度的透镜，折射率变化 代替传统的具有变化的恒定折射率 厚 GRIN透镜可以以小直径尺寸获得。 的 所提出的装置的照明和观察光学器件将包括 长而窄的GRIN棒透镜。 激光二极管将被用作 照明源和检测器阵列或横向效应光电二极管 作为探测器。 第一阶段的研究计划是设计和建造一个 原型设备和 实验证明了非接触式铅笔的可行性 探针 第二阶段计划将修改和优化铅笔 满足最大数量的检测需求。 如果这项研究 如果成功，第三阶段将获得资金将其商业化， 设备. 铅笔探头应增加检查能力和铅 提高质量。 适用于检查复杂的 几何形状，如成型涡轮机叶片，详细说明活塞环 凹槽，观察隐藏在外部视图中的部件，并观察螺纹 在一个洞里。

This proposal is aimed at the ultimate development of a high accuracy, miniature probe capable of inspecting manufactured parts with complex geometries. A novel laser based, non-contact inspection technique will be employed and the device is called a non-contact pencil probe because of its planned shape and size. The optical system is divided into two subsystems; these are illumination and viewing subsystems. A triangulation method will be used. Conventional optical components are not well suited for the pencil probe because of their large relative size. Radically different optical techniques are required to reach the proposed goals. The use of graded index (GRIN) lenses is planned. The GRIN lenses behave optically like conventional lenses but have constant thickness with varied index of refraction instead of the conventional constant index of refraction with varied thickness. GRIN lenses can be obtained in small diameter sizes. The illumination and viewing optics of the proposed device will consist of long narrow GRIN rod lenses. A laser diode will be used as the illumination source and a detector array or a lateral effect photodiode as the detector. The Phase I research plan is to design and build a prototype device and experimentally demonstrate the feasibility of the non-contact pencil probe. A Phase II is planned which will modify and optimize the pencil probe to meet the largest number of inspection needs. If this research is successful, Phase III will obtain funding to commercialize this device. The pencil probe should increase inspection capabilities and lead to improved quality. Application would be to inspection of complex geometries, such as profiling turbine blades, detailing piston ring grooves, viewing parts hidden from external view, and looking at threads within a hole.