Surface Defect Measurements of Computer Hard Disks

这项研究涉及硬盘介质或硬盘基板上的表面缺陷的测量。当磁头在表面上移动时，这些缺陷会影响计算机磁盘的性能。本研究致力于利用非接触式光学扫描干涉法对计算机硬盘表面缺陷进行测量。第二阶段研究的主要目标是测量圆盘在典型旋转条件下的缺陷。对于不同的光盘转速，将研究信噪比、信号带宽、激光光斑大小和聚焦误差的影响。第二阶段研究的预期结果将是开发一种用于表征计算机硬盘表面的整个侧面的设备。随着新的测量技术和测试设备的发展，对已完成的硬盘或未涂覆的硬盘的表面特征的快速非接触测量技术具有潜力，这将有可能提高计算机硬盘的质量。

This research is concerned with the measurement of surface defects on either hard disk media or hard disk substrates. These defects can effect the performance of a computer disk as the head tracks over the surface. The research concentrates on the measurement of surface defects on computer hard disks using non-contact optical scanning interferometry. The primary objective of the Phase II research is to measure the defects under typical rotating conditions of the disk. The effects of the signal to noise ratio, signal bandwidth, laser spot size, and focusing errors will be studied for different disk rotation speeds. The anticipated result of the Phase II research will be the development of a device for the characterization of one entire side of a computer hard disk surface. There is the potential for a rapid non-contacting measurement technique of surface features of a finished hard disk or uncoated hard disk is the development of new measurement techniques and test equipment that will have the potential to improve the quality of computer hard disks.