Surface Defect Measurements of Computer Hard Disks

计算机硬盘的表面缺陷测量

• 批准号: 8722208
• 负责人: Thomas Bristow
• 金额: $ 10.15万
• 依托单位: Photographic Sciences Corporation
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 1988
• 资助国家: 美国
• 起止时间: 1988-09-15 至 1991-02-28
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=8722208&HistoricalAwards=false
• 关键词: Surface; Defect; Measurements; Computer; Hard

This research is concerned with the measurement of surface defects on either hard disk media or hard disk substrates. These defects can effect the performance of a computer disk as the head tracks over the surface. The research concentrates on the measurement of surface defects on computer hard disks using non-contact optical scanning interferometry. The primary objective of the Phase II research is to measure the defects under typical rotating conditions of the disk. The effects of the signal to noise ratio, signal bandwidth, laser spot size, and focusing errors will be studied for different disk rotation speeds. The anticipated result of the Phase II research will be the development of a device for the characterization of one entire side of a computer hard disk surface. There is the potential for a rapid non-contacting measurement technique of surface features of a finished hard disk or uncoated hard disk is the development of new measurement techniques and test equipment that will have the potential to improve the quality of computer hard disks.

本研究涉及表面的测量 硬盘介质或硬盘基板上的缺陷。 这些缺陷会影响计算机磁盘的性能， 头部在表面上跟踪。 研究集中在 计算机硬盘表面缺陷的测量 非接触式光学扫描干涉测量法。 主 第二阶段研究的目标是测量缺陷 在盘的典型旋转条件下。 的影响 信噪比、信号带宽、激光光斑尺寸 并对不同旋转角度下的聚焦误差进行了研究 速度. 第二阶段研究的预期结果将是 一种用于表征一种 电脑硬盘表面的整个侧面。 存在 快速非接触式测量技术的潜力， 完成的硬盘或未涂覆的硬盘的表面特征 是新的测量技术和测试的发展 有可能提高质量的设备 电脑硬盘。