Engineering Research Equipment Grant: Phase Detection Microscopy of Electrode Surfaces

工程研究设备补助金：电极表面的相位检测显微镜

• 批准号: 8807676
• 负责人: Henry White
• 金额: $ 6万
• 依托单位: University of Minnesota-Twin Cities
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1988
• 资助国家: 美国
• 起止时间: 1988-05-01 至 1989-10-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=8807676&HistoricalAwards=false
• 关键词: Engineering; Research; Equipment; Grant; Phase

A phase-detection interferometric microscope (PDIM) is acquired. This instrument measures vertical heights over a modestly large surface area using the technique of optical phase-measurement interferometry, a fast, non-contact optical technique allowing real-time imaging of variations in surface topology with a resolution of about 0.2nm. Time-resolved PDIM imaging will be used in three different electrochemical experiments: preferential anodic dissolution of layered metal dichalcogenide semiconductors at surface defects; surface morphology of activated glassy carbon electrodes in situ; and oxide growth on polycrystalline metal substrates. The instrument also has potential application to problems in surface chemistry, microelectronics, and polymer science.

研制了相位检测干涉显微镜（PDIM）。该仪器使用光学相位测量干涉测量技术测量中等面积表面上的垂直高度，这是一种快速、非接触的光学技术，可以实时成像表面拓扑结构的变化，分辨率约为0.2nm。时间分辨PDIM成像将用于三种不同的电化学实验：层状金属二硫化物半导体在表面缺陷处的优先阳极溶解；原位活性炭电极表面形貌研究以及氧化物在多晶金属衬底上的生长。该仪器在表面化学、微电子和聚合物科学等领域也有潜在的应用前景。