Engineering Research Equipment Grant: Phase Detection Microscopy of Electrode Surfaces

获得了相位检测干涉显微镜（PDIM）。 该仪器测量的垂直高度超过一个适度的大 表面积的光学相位测量技术 干涉测量法是一种快速、非接触的光学技术， 实时成像的变化，在表面拓扑结构与 分辨率约为0.2nm。 时间分辨PDIM成像将用于三个不同的 电化学实验：优先阳极溶解 在表面缺陷处的层状金属二硫属化物半导体; 原位活化玻碳电极的表面形貌; 以及在多晶金属衬底上的氧化物生长。 的 仪器还具有潜在应用于表面问题 化学、微电子学和聚合物科学。

A phase-detection interferometric microscope (PDIM) is acquired. This instrument measures vertical heights over a modestly large surface area using the technique of optical phase-measurement interferometry, a fast, non-contact optical technique allowing real-time imaging of variations in surface topology with a resolution of about 0.2nm. Time-resolved PDIM imaging will be used in three different electrochemical experiments: preferential anodic dissolution of layered metal dichalcogenide semiconductors at surface defects; surface morphology of activated glassy carbon electrodes in situ; and oxide growth on polycrystalline metal substrates. The instrument also has potential application to problems in surface chemistry, microelectronics, and polymer science.