Soft X-ray Extended Adsorption Structure (XAS) Studies of Amorphous and Disordered Materials

非晶和无序材料的软 X 射线扩展吸附结构 (XAS) 研究

• 批准号: 8813736
• 负责人: Timothy Morrison
• 金额: $ 9.9万
• 依托单位: Illinois Institute of Technology
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 1989
• 资助国家: 美国
• 起止时间: 1989-01-01 至 1991-06-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=8813736&HistoricalAwards=false
• 关键词: Soft; ray; Extended; Adsorption; Structure

Soft X-ray EXAFS and XANES studies will be undertaken to complement previous or ongoing X-ray absorption spectroscopic studies of amorphous and disordered materials. Previously, it has not been possible to access all the absorption edges of all the elements in disordered or amorphous alloys or glassy materials, and consequently it has not been possible to fully characterize the short-range order in these systems. However, with the recent commissioning of the soft X-ray beamline X-11B at the National Synchrotron Light Source at Brookhaven, they have access to the spectral regime in which is found the absorption edges of aluminum, silicon, phosphorus, and sulfur; this new capability will allow them to further extend their EXAFS studies and get a more complete picture of the nature of the ordering in materials containing these elements.

将进行软X射线EXAFS和XANES研究， 补充先前或正在进行的X射线吸收光谱 无定形和无序材料的研究。 此前 尚不可能访问所有的所有吸收边缘 无序或无定形合金或玻璃态的元素 材料，因此无法完全 描述这些系统中的短程有序。 然而，在这方面， 随着软X射线束线X-11B最近在 布鲁克海文的国家同步加速器光源 进入其中发现吸收的光谱区域 铝、硅、磷和硫的边缘;这种新的 这种能力将使他们能够进一步扩展EXAFS研究 更全面地了解 含有这些元素的材料。