Soft X-ray Extended Adsorption Structure (XAS) Studies of Amorphous and Disordered Materials

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Soft X-ray EXAFS and XANES studies will be undertaken to complement previous or ongoing X-ray absorption spectroscopic studies of amorphous and disordered materials. Previously, it has not been possible to access all the absorption edges of all the elements in disordered or amorphous alloys or glassy materials, and consequently it has not been possible to fully characterize the short-range order in these systems. However, with the recent commissioning of the soft X-ray beamline X-11B at the National Synchrotron Light Source at Brookhaven, they have access to the spectral regime in which is found the absorption edges of aluminum, silicon, phosphorus, and sulfur; this new capability will allow them to further extend their EXAFS studies and get a more complete picture of the nature of the ordering in materials containing these elements.