Fault Detection and Board-Level Diagnosis by Signature Analysis

这是波士顿大学的M. Karpovsky教授和马萨诸塞大学的D. Pradhan教授的合作成果。拟议的调查是双重的。第一个是通过压缩测试响应来检测故障。错误（故障的表现）被定义为组件。实际测试响应和无故障响应之间明智的互斥或。如果观察到的签名（压缩测试响应）等于参考，则会屏蔽故障。因此，根据误差统计，最优压缩器是将测试响应压缩到参考中的概率最小化的压缩器。研究给定电路中包含的误差序列分布已知时的最优压缩器的设计。这项工作也是基于有限域内的单个纠错码。第二艘船。通过特征分析进行水平诊断。目的是分析电路板上冗余芯片的硬件复杂性和测试时间之间的权衡。目前正在研究两种基于测试响应压缩的技术。这些都是;空间。测试响应的时间压缩——空间压缩器研究的延伸在有限域上用汉明码进行板诊断。卡尔波夫斯基和普拉丹教授都是杰出的研究人员，在过去十年中取得了坚实的成就，他们很有可能继续进行一流的研究。试验响应分析这一研究课题对行业具有重要意义，且具有很高的应用价值。设计，工具和测试程序中的优先类别。

This is a collaborative effort between Professors M. Karpovsky at BostonUniversity and D. Pradhan at the University of Massachusetts. The proposedinvestigations are two.fold. The first concerns fault detection by acompression of test responses. Errors (manifestations of faults) are definedas the component.wise exclusive OR between actual test responses and fault.free responses. Faults are masked if the observed signature (compressed test response) is equal to the reference. Thus, depending on the statistics of theerrors, an optimal compressor is the compressor that minimizes a probabilitythat the test responses are compressed into the reference. The design ofoptimal compressors when the distribution of ones contained in error sequences is known for a given circuit under test is being investigated. This work isalso based on single error correcting codes over a finite field. Second isboard . level diagnosis by signature analysis. The objective is to analyzetradeoffs between the hardware complexity of the redundant chips on the boardand test time. Two techniques, based on compression of test responses, arebeing pursued. These are; space . time compression of test responses, anextension of previous research in space compressors; and board diagnosis byHamming codes over a finite field. Professors Karpovsky and Pradhan, are outstanding researchers with solidrecords of accomplishment over the past decade, and that they are very likelyto continue first class research. The research topic, test response analysis, is important to industry, and is a high.priority category within the Design,Tools and Test Program.