On-Line and Off-Line Error Detection Mechanisms in the Coding Theory Framework

编码理论框架中的在线和离线错误检测机制

• 批准号: 9208487
• 负责人: Mark Karpovsky
• 金额: --
• 依托单位: Trustees of Boston University
• 依托单位国家: 美国
• 项目类别: Continuing grant
• 财政年份: 1992
• 资助国家: 美国
• 起止时间: 1992-08-01 至 1996-01-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9208487&HistoricalAwards=false
• 关键词: Line; Off; Error; Detection; Mechanisms

Karpovsky This research focuses on the development of a unified framework for combining on-line and off-line error detection mechanisms at both the chip and board levels. This framework includes: concurrent checking of the device for on-line detection, space and time compression of test responses, analysis of distortions in the resulting signatures for error detection and diagnosis for built-in self-testing (BIST), and concurrent checking of hardware required for (BIST).

Karpovsky这项研究的重点是开发一个统一的框架，结合在线和离线错误检测机制，在芯片和板级。这一框架包括：用于在线检测的设备的并发检查、测试响应的空间和时间压缩、用于错误检测和诊断的所得签名中的失真的分析以用于内建自测试（BIST），以及用于（BIST）所需的硬件的并发检查。