On-Line and Off-Line Error Detection Mechanisms in the Coding Theory Framework

Karpovsky这项研究的重点是开发一个统一的框架，结合在线和离线错误检测机制，在芯片和板级。这一框架包括：用于在线检测的设备的并发检查、测试响应的空间和时间压缩、用于错误检测和诊断的所得签名中的失真的分析以用于内建自测试（BIST），以及用于（BIST）所需的硬件的并发检查。

Karpovsky This research focuses on the development of a unified framework for combining on-line and off-line error detection mechanisms at both the chip and board levels. This framework includes: concurrent checking of the device for on-line detection, space and time compression of test responses, analysis of distortions in the resulting signatures for error detection and diagnosis for built-in self-testing (BIST), and concurrent checking of hardware required for (BIST).