Measuring Double Layer Forces Using Total Internal Reflection Microscopy

使用全内反射显微镜测量双层力

• 批准号: 8907739
• 负责人: Stacy Bike
• 金额: $ 6万
• 依托单位: Regents of the University of Michigan - Ann Arbor
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1989
• 资助国家: 美国
• 起止时间: 1989-08-01 至 1992-07-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=8907739&HistoricalAwards=false
• 关键词: Measuring; Double; Layer; Forces; Using

This research will employ a technique called total internal reflection microscopy (TIRM) for the measurement of colloidal particle position relative to a flat surface. TIRM is based on measuring the intensity of light scattered by a particle in the evanescent wave region of an otherwise totally reflecting surface. Due to the strong variation of intensity with distance, nanometer resolution is possible. By measuring the time variations of position for a system at equilibrium, one is able to infer the potential energy of interaction or force between the particle and surface as functions of the separation. The technique will be improved and used to deduce electrical double layer forces. The research should provide a new and extremely useful tool for colloid science. It will give a critical evaluation of the theories for colloidal forces. The results will be very important to understanding particle deposition rates and deposition patterns as well as consolidation of green bodies dominated by colloidal forces.

这项研究将采用一种称为全内反射的技术 用于测量胶体颗粒位置的TIRM 相对于平面。 TIRM基于测量强度 光散射的粒子在倏逝波区的一个 或者全反射表面。 由于变化剧烈， 强度与距离，纳米分辨率是可能的。 通过 测量处于平衡状态的系统的位置的时间变化， 人们能够推断出相互作用或力的势能 作为分离的函数的粒子和表面之间。 的 技术将得到改进，并用于推导双电层 力. 这项研究应该为以下方面提供一个新的和非常有用的工具： 胶体科学 对这些理论进行批判性的评价 关于胶体力。 结果将非常重要， 了解颗粒沉积速率和沉积模式， 以及由胶体力主导的绿色体的固结。