RIA: The Application of Boolean Satisfiability Test Pattern Generation for Non-Stuck-At Faults

测试组合电路的布尔可满足性方法分两步生成测试模式。首先，构造了一个表示无故障电路和故障电路之间布尔差值的公式。其次，对所得公式应用布尔可满足性算法。这与目前大多数直接搜索电路数据结构的测试方法不同。当缺陷可以用单卡故障模型来建模时，该方法可以有效地识别缺陷组合电路。该研究将布尔可满足性方法扩展到处理各种各样的非经典故障。对桥接和延迟故障检测方法的改进正在研究中。

The Boolean satisfiability method for testing combinational circuits generates test patterns in two steps. First, it constructs a formula expressing the Boolean difference between the unfaulted and faulted circuits. Second, it applies a Boonlean satisfiability algorithm to the resulting formula. This differs from most current approaches to testing which directly search the circuit data structure. This method has been shown to be effective in identifying defective combinational circuits when the defects can be modeled by the single stuck at fault model. This research is extending the Boolean satisfiability method to handle a wide variety of nonclassical faults. Modifications to the method to detect bridging and delay faults are being investigated.