RIA: The Application of Boolean Satisfiability Test Pattern Generation for Non-Stuck-At Faults

RIA：布尔可满足性测试模式生成在非固定故障中的应用

• 批准号: 9011254
• 负责人: Tracy Larrabee
• 金额: $ 7.74万
• 依托单位: University of California-Santa Cruz
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1990
• 资助国家: 美国
• 起止时间: 1990-07-01 至 1992-12-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9011254&HistoricalAwards=false
• 关键词: RIA; Application; Boolean; Satisfiability; Test

The Boolean satisfiability method for testing combinational circuits generates test patterns in two steps. First, it constructs a formula expressing the Boolean difference between the unfaulted and faulted circuits. Second, it applies a Boonlean satisfiability algorithm to the resulting formula. This differs from most current approaches to testing which directly search the circuit data structure. This method has been shown to be effective in identifying defective combinational circuits when the defects can be modeled by the single stuck at fault model. This research is extending the Boolean satisfiability method to handle a wide variety of nonclassical faults. Modifications to the method to detect bridging and delay faults are being investigated.

测试组合电路的布尔可满足性方法 生成测试模式分两步。 首先，它构造了一个公式 表示无故障和故障之间的布尔差 电路. 其次，它应用了Boonlean可满足性算法， 产生的公式。 这与当前大多数测试方法不同 其直接搜索电路数据结构。 该方法已 显示在识别有缺陷的组合电路中是有效的 当缺陷可以由单一的卡在故障模型来建模时。 本研究将布尔可满足性方法扩展到处理 各种各样的非经典故障。 修改方法， 正在研究检测桥接和延迟故障。