PYI: Sequential and Combinational Test Pattern Generation for Realistic Faults Using Boolean Satisfiability

PYI：使用布尔可满足性针对实际故障生成顺序和组合测试模式

• 批准号: 9158490
• 负责人: Tracy Larrabee
• 金额: $ 34.6万
• 依托单位: University of California-Santa Cruz
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 1991
• 资助国家: 美国
• 起止时间: 1991-10-01 至 1999-09-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9158490&HistoricalAwards=false
• 关键词: PYI; Sequential; Combinational; Test; Pattern

Larrabee This research is based on an automatic test pattern generation (ATPG) system (called Nemesis) that generates a test pattern for a given fault by first constructing a formula representing all possible tests for the fault, and then applying a Boolean satisfiability algorithm to the resulting formula. This method separates the formula extraction from the formula satisfaction thus providing flexibility and generality. A testing system, based on Nemesis, that will generate tests detecting all realistic manufacturing defects in both combinational and sequential ICs is being developed.

Larrabee 这项研究基于自动测试模式生成 (ATPG) 系统（称为 Nemesis），该系统通过首先构建表示该故障的所有可能测试的公式，然后将布尔可满足性算法应用于所得公式来生成给定故障的测试模式。 该方法将公式提取与公式满足分开，从而提供灵活性和通用性。 正在开发一种基于 Nemesis 的测试系统，该系统将生成检测组合 IC 和顺序 IC 中所有实际制造缺陷的测试。