PYI: Sequential and Combinational Test Pattern Generation for Realistic Faults Using Boolean Satisfiability

点击翻译按钮获取中文摘要

Larrabee This research is based on an automatic test pattern generation (ATPG) system (called Nemesis) that generates a test pattern for a given fault by first constructing a formula representing all possible tests for the fault, and then applying a Boolean satisfiability algorithm to the resulting formula. This method separates the formula extraction from the formula satisfaction thus providing flexibility and generality. A testing system, based on Nemesis, that will generate tests detecting all realistic manufacturing defects in both combinational and sequential ICs is being developed.