RUI: Enhancing VLSI Circuit Yields Through Identifying Design Sensitivities

这笔赠款用于开发用于集成电路故障统计分析的软件工具。该工具将用于现有的故障率数据，以定位产生故障的电路参数的不可预测的组合。统计方法是必要的，因为失效数据的随机性和大量的参数相互作用，而这些参数的作用方式至今知之甚少。这些参数组合有助于深入了解这些相互作用的性质。这种洞察力将使用人工智能技术进行系统化。

This grant funds the development of a software tool for the statistical analysis of integrated circuit failures. The tool will be used on existing failure rate data to locate unpredicted combinations of circuit parameters that produce failure. Statistical methods are necessary because of the randomness in failure data and the very large number of parameters which interact to as yet poorly understood ways. These parameter combinations yield insight on the nature of those interactions. This insight will be systematized using artificial intelligence techniques.