RUI: Enhancing VLSI Circuit Yields Through Identifying Design Sensitivities

RUI：通过识别设计敏感性提高 VLSI 电路良率

• 批准号: 9017151
• 负责人: Bei-Tseng Chu
• 金额: $ 8.6万
• 依托单位: University of North Carolina at Charlotte
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1991
• 资助国家: 美国
• 起止时间: 1991-02-01 至 1994-01-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9017151&HistoricalAwards=false
• 关键词: RUI; Enhancing; VLSI; Circuit; Yields

This grant funds the development of a software tool for the statistical analysis of integrated circuit failures. The tool will be used on existing failure rate data to locate unpredicted combinations of circuit parameters that produce failure. Statistical methods are necessary because of the randomness in failure data and the very large number of parameters which interact to as yet poorly understood ways. These parameter combinations yield insight on the nature of those interactions. This insight will be systematized using artificial intelligence techniques.

这笔拨款用于开发集成电路故障统计分析软件工具。该工具将用于现有的故障率数据，以定位产生故障的不可预测的电路参数组合。统计方法是必要的，因为失效数据的随机性和非常大量的参数相互作用的方式尚不清楚。这些参数组合产生了对这些相互作用本质的洞察。这种见解将使用人工智能技术系统化。