RUI: Enhancing VLSI Circuit Yields Through Identifying Design Sensitivities

这笔赠款资助开发一个软件工具， 集成电路故障的统计分析。 该工具将 用于现有的故障率数据，以定位不可预测的 产生故障的电路参数的组合。 统计学方法是必要的，因为 故障数据和大量相互作用的参数 到目前为止还不为人知的方式。 这些参数组合 产生对这些相互作用的本质的洞察力。 这种洞察力 将使用人工智能技术系统化。

This grant funds the development of a software tool for the statistical analysis of integrated circuit failures. The tool will be used on existing failure rate data to locate unpredicted combinations of circuit parameters that produce failure. Statistical methods are necessary because of the randomness in failure data and the very large number of parameters which interact to as yet poorly understood ways. These parameter combinations yield insight on the nature of those interactions. This insight will be systematized using artificial intelligence techniques.