Acquisition of a Scanning Microdensitometer

购买扫描显微密度计

• 批准号: 9017235
• 负责人: Raymond Jeanloz
• 金额: $ 2.63万
• 依托单位: University of California-Berkeley
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1991
• 资助国家: 美国
• 起止时间: 1991-02-01 至 1993-01-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9017235&HistoricalAwards=false
• 关键词: Acquisition; Scanning; Microdensitometer

This award provides support for the acquisition and modification of components into a microdensitometer system for measuring the intensities of diffracted x-rays as recorded on x- ray sensitive film. The instrument will be developed and installed in the Department of Geology and Geophysics at the University of California at Berkeley. It will be used primarily in the characterization of materials subjected to ultra-high pressures during laboratory experiments intended to mimic conditions inside the Earth's deep interior.

该奖项为微密度计系统中组件的采集和修改提供支持，用于测量 X 射线敏感胶片上记录的衍射 X 射线的强度。该仪器将在加州大学伯克利分校地质与地球物理系开发并安装。它将主要用于模拟地球内部深处条件的实验室实验期间承受超高压的材料的表征。