Optical Threshold Control Technique for Detection of Physical Failure in MOS Devices

用于检测 MOS 器件物理故障的光阈值控制技术

• 批准号: 9123186
• 负责人: M. Taghi Mostafavi
• 金额: $ 4.99万
• 依托单位: University of North Carolina at Charlotte
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1992
• 资助国家: 美国
• 起止时间: 1992-03-15 至 1994-12-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9123186&HistoricalAwards=false
• 关键词: Optical; Threshold; Control; Technique; Detection

Theoretical work and software simulation indicate the potential to use light to change transistor threshold values. By this technique a circuit can be placed into a mode ready for testing, with all switching devices activated to the same voltage level. In this research, the logical and electrical behavior of MOS transistors as the optical effect changes threshold values is being studied. Also being studied are changes in the electrical properties of switching devices (inverters and transmission gates) due to optical effects. Experiments on fabricated devices to determine if a stable optical threshold control can be designed are being performed. Also being investigated are methods of detecting the presence of defects through changes in signals at the output lines. This proposal was submitted under the Small Grants for Exploratory Research Program.

理论工作和软件模拟表明， 使用光来改变晶体管阈值。 通过这种技术 可以将电路置于准备测试的模式， 开关设备被激活到相同的电压电平。 在这 研究，MOS晶体管的逻辑和电气行为 当光学效应改变时，正在研究阈值。 也正在研究的是电性能的变化， 开关器件（逆变器和传输门），由于光 方面的影响. 在制造的设备上进行实验，以确定 可以设计稳定的光阈值控制器 执行。 也正在研究的是检测 通过输出线上的信号变化而存在缺陷。 该提案是在探索性研究小额赠款下提交的。 研究计划。