Presidential Young Investigator Award

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In this study periodic multilayer thin films and their component parts (single layers, bilayers, trilayers, etc.) are grown and characterized by vibrating sample and torque magnetometry, ferromagnetic resonance, transmission electron microscopy, and X- ray diffraction. The goal is to determine the interrelationships between multilayer ferromagnetism, film microstructure, interfacial structure and composition, and growth processes. Model experimental systems and systematic incremental annealing treatments are used to establish direct correlations between the structural and compositional evolution of the interphase interfaces and the concurrently developing ferromagnetic properties. The role of crystalline anisotropy in diffusional mixing, interfacial compound formation, and interfacial magnetism is also under investigation. Attention is being directed to nickel-based multilayer systems with copper, aluminum, or titanium intervening layers.