Computer-aided Instruction of Surface Analysis Techniques

点击翻译按钮获取中文摘要

Four of the most important surface analytical techniques for materials science are: (1) Auger Electron Spectrometry, (2) X- ray Photo-electron Spectrometry, (3) Secondary Ion Mass Spectrometry, and (4) Rutherford Backscattering Spectrometry. While of widespread use, there has not been a concomitant increase in their emphasis at educational institutions. The research effort in this project is the creation of a Computer- Aided Instruction (CAI) laboratory resource for surface analysis education. Instrumental, experimental, and theoretical considerations for the techniques will be presented along with the ability to design and conduct hypothetical experiments.