RIA: Analysis of Failure Mechanisms in Thin Coatings

RIA：薄涂层失效机制分析

• 批准号: 9210316
• 负责人: Allan Bower
• 金额: $ 9万
• 依托单位: Brown University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1992
• 资助国家: 美国
• 起止时间: 1992-09-01 至 1996-02-29
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9210316&HistoricalAwards=false
• 关键词: RIA; Analysis; Failure; Mechanisms; Thin

A Research Initiation Award will support development of an analysis of the potential failure mechanisms of thin coatings. Three main forms of failure will be considered: fracture of the coating or substrate or of their interface, plastic flow in single and multiple loading, and failure by creep induced crack growth. Interfacial fracture of brittle coatings on brittle substrates will be modeled using interfacial fracture mechanics. For hard coatings on a ductile substrate a shakedown limit method will be used to calculate the cyclic plastic deformation of layered solids under repeated contact loading. In addition, models will be developed to analyze time dependent crack and void growth in thin films under high triaxial residual stresses.

研究启动奖将支持分析的发展 薄涂层的潜在失效机制。 三个主要 将考虑失效形式：涂层断裂或 基材或其界面，塑料流在单一和 多次加载和蠕变引起的裂纹扩展破坏。 脆性基体上脆性涂层的界面断裂 使用界面断裂力学建模。 硬质涂层 在韧性基底上，将使用安定极限方法， 计算层状固体的循环塑性变形 反复接触加载。 此外，还将开发模型 分析薄膜中随时间变化的裂纹和空洞生长， 高三轴残余应力