Fault Modeling and Test Generation for Mixed-Signal Integrated Circuits

亚伯拉罕 本文研究混合信号集成电路的故障建模和测试生成。 在故障模型领域，缺陷和成品率统计被用于推导模拟电路的综合故障模型。 这些包括可用于测试设计和测试生成的功能故障模型。 新的测试生成算法正在为模拟电路推导，并且正在开发将模拟测试与混合信号电路中的数字电路接口的技术。 基本理论正在通过工业设计和数据进行实验验证。

Abraham This research is on fault modeling and test generation for mixed signal integrated circuits. In the area of fault models, defect and yield statistics are being used to derive comprehensive fault models for analog circuits. These include functional fault models useable in design for test and test generation. New test generation algorithms are being derived for analog circuits, and techniques are being developed to interface the analog tests with the digital circuitry in a mixed signal circuit. The fundamental theories are being validated experimentally with designs and data from industry.