Hierarchical Testability Analysis and Design Verification for Analog and Mixed-Signal Systems

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This joint work between Prof. Mani Soma (U. of Washington) and Jacob Abraham (U. of Texas). The research is on fault models, test generation, and design verification for analog and mixed-signal Integrated circuits. A top-down approach to test and verification in mixed-signal design is being pursued. Research topics include the following. Develop algorithms for abstracting a circuit from the description of a mixed-signal circuit. Define testability figures of merit for major analog blocks such as converters, filters, etc., and develop methods to compute them. Investigate algorithms to evaluate testability of mixed-signal design using high level design information. For design verification, the group is finding accurate transformation algorithms to map analog blocks to discretized form. Also, abstractions to reduce state space complexity during verification are being explored. The algorithms and methods are being built into testability and test tools.