Acquisition of an Analytical Transmission Electron Microscope for Materials Research

9303794 AKSAY这台带有分析和高分辨率成像附件的透射电子显微镜将用于改善普林斯顿大学材料科学和工程方面的研究和教学。普林斯顿材料研究所(PMI)将为一个多学科的瞬变电磁中心提供选址和支持。普林斯顿大学的材料研究涉及来自几个系(化学、电气、机械和土木工程、物理、化学、分子生物学和地球科学)的55名教职员工之间的合作，并由PMI协调。主要的透射电子显微镜系统将包括：(I)用于高分辨率电子显微镜(HREM)成像和会聚束电子衍射(CBED)的具有高分辨率极片的TEM，(Ii)扫描透射式电子显微镜(STEM)附件，(Iii)能量色散X射线光谱仪(EDS)，(Iv)带有能量过滤器的电子能量损失光谱仪(EELS)，以及(V)用于数据采集、存储和处理的多通道分析器和支持计算机。该仪器能够对晶体和非晶态结构进行高空间分辨率成像、小束电子衍射以及微米和纳米尺度特征的成分和光谱分析，所有这些都是表征材料结构的必要工具。它将取代目前的瞬变显微镜(飞利浦400)，它的空间分辨率不足，没有分析附件。虽然目前的显微镜不能用于高分辨率的研究，但它将被保留用于教学。事实上，PMI正在为研究生和本科生推广一系列教授电子显微镜的课程。在新的PMI大楼中专门为这种仪器提供了实验室空间，并任命了新的教职员工，这些教职员工都具有瞬变显微镜和材料科学方面的专业知识，这证明了人们对瞬变显微镜对普林斯顿大学的重要性的认识。这些科学家将作为显微镜工作者的专门核心，使显微镜设施能够满足当前研究和教育需求的关键需求，并为普林斯顿大学材料科学的教学和合作研究开辟新的途径。***

9303794 Aksay This transmission electron microscope (TEM) with analytical and high resolution imaging attachments will be used to improve research and education in materials sciences and engineering at Princeton University. The Princeton Materials Institute (PMI) will provide the location and support for a multidisciplinary TEM center. Materials research at Princeton University involves collaboration among 55 faculty members from several departments (Chemical, Electrical, Mechanical, and Civil Engineering, Physics, Chemistry, Molecular Biology, and Earth Sciences) and is coordinated by the PMI. The primary TEM system will comprise: (i)a TEM with a high resolution pole piece for high resolution electron microscopy (HREM) imaging and convergent beam electron diffraction (CBED), (ii)a scanning transmission electron microscopy (STEM) accessory (iii)an energy dispersive X-ray spectrometer (EDS), (iv)an electron energy loss spectrometer (EELS) with an energy filter, and (v)a multichannel analyzer and support computers for data acquisition, storage, and processing. This instrument is capable of high spatial resolution imaging of crystalline and amorphous structures, small-beam electron diffraction, and compositional and spectroscopic analyses of micro- and nano-scale features, all necessary tools for characterizing materials structures. It will replace the present TEM (Philips 400) which has inadequate spatial resolution and no analytical attachments. Although the current microscope cannot be used for high resolution studies, it will be retained for teaching. In fact, PMI is promoting a series of courses for both graduates and undergraduates in which electron microscopy is taught. The recognition of the importance of TEM to Princeton is evidenced by the dedication of laboratory space specifically for this instrument in the new PMI building and the appointment of new faculty and staff with expertise in both TEM and materials sciences. These sc ientists will serve as a dedicated core of microscopists who will enable the microscopy facility to meet the critical demands of the present research and educational needs as well as to open new avenues in teaching and collaborative research in materials sciences at Princeton University. ***