MRI: Acquisition of a High-Resolution Analytical Transmission Electron Microscope

MRI：获取高分辨率分析透射电子显微镜

• 批准号: 0922776
• 负责人: Zhong Wang
• 金额: $ 123.23万
• 依托单位: Georgia Tech Research Corporation
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2009
• 资助国家: 美国
• 起止时间: 2009-10-01 至 2012-09-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0922776&HistoricalAwards=false
• 关键词: MRI; Acquisition; Resolution; Analytical; Transmission

0922776WangGA Tech Research Corporation - GITTechnical Summary: Science and technology in the 21st century will rely heavily on the development of new materials with properties that can be tailored according to performance requirements. The development of smart materials will undoubtedly contribute to a revolution in many fields of science and technology such as information science, microelectronics, computer science, medical analysis, life sciences, energy, transportation, safety engineering and military technologies. A key piece of infrastructure for nanotechnology and materials science is a first class imaging and analysis facility, which is capable of providing sub-Angstrom resolution imaging and atom-column localized chemical information. The objective of this proposal is to acquire a state-of-the-art 300 keV field emission transmission/scanning electron microscope (TEM/STEM) with a 0.19 nm point-to-point image resolution and 0.2 nm diameter high-brightness nanoprobe, a high stability specimen stage (1 Å drift/min-1), a high collection efficiency solid state x-ray detector(s), beam scanning capabilities (for x-ray mapping), and a sub-eV energy resolution electron energy-loss spectrometer. The TEM/STEM is designed to meet the needs of a large research community of more than 500 per year in nanotechnology and materials science at the Georgia Institute of Technology. The most powerful application of an advanced TEM is its super-high resolution for imaging the atomic structure of materials at a resolution of ~0.1-0.2 nm. Combined with electron diffraction, TEM is unique in determining the defect, interface and domain structures of materials. Complimenting this powerful imaging capability, X-ray energy-dispersive spectrometry (EDS) and electron energy-loss spectroscopy (EELS) by far the most rapid and convenient method for measuring the composition of a specimen in the TEM at a spatial resolution approximately the size of the electron probe. By using a high-coherence, high-brightness electron probe, a spatial resolution of ~0.2 nm can be achieved for thin samples. EDS represents the most powerful technique for quantifying the composition of elements as light as nitrogen. Layman Summary: The development of smart materials continues to be a revolution in many fields of science and technology such as information science, microelectronics, computer science, medical analysis, life sciences, energy, transportation, safety engineering and military technologies. Materials development in the future, therefore, should be directed toward creation of hyperfunctional materials which may surpass even biological organs in some aspects. A key challenge is to correlate the material's structure with its properties in order to fully control structural and compositional evolution for achieving superior performance. Electron microscopy and associated analysis techniques have proven to be one of the most powerful techniques for exploring the nanoscopic world associated with a variety of materials and devices. The proposed HRTEM will represent strategic equipment for all of the nano- and bio-research programs at Georgia Tech. This will impact numerous programs distributed over 10 units, campus-wide, including but not limited to: advanced catalysis, photovoltaic materials, energy storage and generation, biosensing, bioimaging, drug delivery, composite materials, electronic packaging and interconnects. The proposed TEM will produce over 500 research articles per year. It will also impact local industry in the Atlanta area. It will make huge contribution to the education and training of undergraduate students, graduate students and postdoctoral fellows.

0922776 WangGA Tech Research Corporation -GIT技术概要：世纪的科学技术将在很大程度上依赖于开发具有可根据性能要求定制的性能的新材料。智能材料的发展无疑将在信息科学、微电子学、计算机科学、医学分析、生命科学、能源、交通、安全工程和军事技术等许多科学技术领域带来一场革命。纳米技术和材料科学基础设施的一个关键部分是一流的成像和分析设施，它能够提供亚埃分辨率成像和原子柱局部化学信息。本提案的目的是获得最先进的300 keV场发射透射/扫描电子显微镜（TEM/STEM），具有0.19 nm的点对点图像分辨率和0.2 nm直径的高亮度纳米探针，高稳定性样品台（1 μ s漂移/min-1）、高收集效率固态X射线检测器、射束扫描能力（用于X射线映射）和亚eV能量分辨率电子能量损失谱仪。TEM/STEM旨在满足格鲁吉亚理工学院每年超过500人的纳米技术和材料科学大型研究社区的需求。先进TEM最强大的应用是其超高分辨率，可在约0.1-0.2 nm的分辨率下成像材料的原子结构。TEM与电子衍射相结合，在确定材料的缺陷、界面和畴结构方面具有独特的优势。补充这种强大的成像能力，X射线能量色散谱仪（EDS）和电子能量损失谱仪（EELS）到目前为止最快速和方便的方法来测量样品的成分在TEM的空间分辨率约为电子探针的大小。 通过使用高相干、高亮度的电子探针，对于薄样品可以实现~0.2 nm的空间分辨率。EDS代表了对轻如氮的元素的组成进行定量的最强大的技术。Layman总结：智能材料的发展持续成为信息科学、微电子学、计算机科学、医学分析、生命科学、能源、交通、安全工程和军事技术等众多科技领域的一场革命。因此，未来材料的发展方向应该是创造在某些方面甚至超过生物器官的超功能材料。一个关键的挑战是将材料的结构与其性能相关联，以便完全控制结构和成分的演变，从而实现上级性能。电子显微镜和相关的分析技术已被证明是探索与各种材料和设备相关的纳米世界的最强大的技术之一。拟议中的HRTEM将代表格鲁吉亚理工学院所有纳米和生物研究项目的战略设备。这将影响分布在10个单位，校园范围内的许多程序，包括但不限于：先进催化，光伏材料，能量存储和发电，生物传感，生物成像，药物输送，复合材料，电子封装和互连。拟议的TEM每年将产生500多篇研究文章。这也将影响亚特兰大地区的当地工业。它将为本科生、研究生和博士后的教育和培养做出巨大贡献。