SGER: Quantitative Microbeam Determination of Iron Valence Using XPS

这个探索性项目的目标是开发一种微束技术（~ 40um点尺寸），用于在抛光薄片中对硅酸盐矿物和玻璃中的铁和亚铁进行原位分析。所提出的技术包括通过x射线光电子能谱（XPS）分析在高真空样品室中通过切割或刮擦感兴趣的材料产生的新表面。该技术的成功开发将使地球科学家能够研究组成分带矿物中铁的空间变化，并且它将消除既耗时又可能氧化的样品制备的需要。分析结果可应用于氧化还原过程的研究和变质岩的热气压测定。

9307389 Kerrick The objective of this exploratory project is to develop a microbeam technique (~40 um spot size) for the in situ analysis of ferric and ferrous iron in silicate minerals and glasses in polished thin sections. The proposed technique involves analysis by x-ray photoelectron spectroscopy (XPS) of a fresh surface produced by cleaving or scraping the material of interest within the high vacuum sample chamber. Successful development of the technique would enable geoscientists to study the spatial variations of feric iron in compositionally zoned minerals, and it would eliminate the need for sample preparation that is both time-consuming and potentially oxidizing. The analytical results would find application in the study of redox processes and in thermobarometry of metamorphic rocks.