RIMI: Materials Characterization Facilities
RIMI: Materials Characterization Facilities
批准号:
9353197
负责人:
Carlos Cabrera
金额:
$33.26万
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
1993
资助国家:
美国
项目状态:
已结题
起止时间:
1993-09-01 至 1997-02-28
中文摘要
9353197卡布雷拉该提案要求提供资金,以建立一个材料表征设施,购置表面分析仪器。该仪器由俄歇电子能谱仪和X射线光电子能谱仪组成,将有助于环境化学、薄膜、催化、材料科学和电化学等领域的当前研究。表面分析仪器将通过测定大多数元素的组成以及杂质,具体加强对过渡金属二卤化物和铁电薄膜加工的研究。二卤化物和铁电薄膜分别用于太阳能电池和光电设备。杂质成分会显著影响材料的半导体和磁性,通常通过化学气相沉积、溶胶-凝胶技术或电沉积来制备。材料表征设施将极大地提高从根本上调查上述材料加工的研究人员的解释能力。***
英文摘要
9353197 Cabrera The proposal requests funds to establish a materials characterization facility with the acquisition of surface analytical instrumentation. The instrumentation consists of an Auger electron spectrometer and an X-ray photoelectron spectrometer and will aid current research in environmental chemistry, thin films, catalysis, materials science and electrochemistry. The surface analytical instrumentation will specifically enhance the research on the processing of transition metal dichalcogenides and ferroelectric films, by determining the composition of majority elements, as well as impurities. The dichalcogenides and ferroelectric films are used for solar energy batteries and optical-electrical devices, respectively. The impurity composition can significantly affect the semiconductive and magnetic properties of the materials, which are usually prepared by chemical vapor deposition, sol-gel techniques or electrodeposition. The material characterization facility will dramatically improve the interpretative capabilities of the researchers investigating fundamentally the processing of the foregoing materials. ***
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