RIMI: Materials Characterization Facilities

RIMI：材料表征设施

• 批准号: 9353197
• 负责人: Carlos Cabrera
• 金额: $ 33.26万
• 依托单位: University of Puerto Rico-Rio Piedras
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1993
• 资助国家: 美国
• 起止时间: 1993-09-01 至 1997-02-28
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9353197&HistoricalAwards=false
• 关键词: RIMI; Materials; Characterization; Facilities

9353197 Cabrera The proposal requests funds to establish a materials characterization facility with the acquisition of surface analytical instrumentation. The instrumentation consists of an Auger electron spectrometer and an X-ray photoelectron spectrometer and will aid current research in environmental chemistry, thin films, catalysis, materials science and electrochemistry. The surface analytical instrumentation will specifically enhance the research on the processing of transition metal dichalcogenides and ferroelectric films, by determining the composition of majority elements, as well as impurities. The dichalcogenides and ferroelectric films are used for solar energy batteries and optical-electrical devices, respectively. The impurity composition can significantly affect the semiconductive and magnetic properties of the materials, which are usually prepared by chemical vapor deposition, sol-gel techniques or electrodeposition. The material characterization facility will dramatically improve the interpretative capabilities of the researchers investigating fundamentally the processing of the foregoing materials. ***

9353197 Cabrera 该提案要求提供资金来建立材料表征设施并购买表面分析仪器。 该仪器由俄歇电子能谱仪和 X 射线光电子能谱仪组成，将有助于当前环境化学、薄膜、催化、材料科学和电化学方面的研究。 表面分析仪器将通过确定主要元素以及杂质的成分，专门加强对过渡金属二硫属化物和铁电薄膜加工的研究。 二硫属化物和铁电薄膜分别用于太阳能电池和光电器件。 杂质成分会显着影响材料的半导体和磁性特性，这些材料通常通过化学气相沉积、溶胶-凝胶技术或电沉积来制备。 材料表征设施将极大地提高研究人员从根本上研究上述材料加工的解释能力。 ***