Study of Thin-Film Structures for Optoelectronic Applications

光电应用薄膜结构的研究

• 批准号: 9522078
• 负责人: Theodor Tamir
• 金额: --
• 依托单位: Polytechnic University of New York
• 依托单位国家: 美国
• 项目类别: Continuing grant
• 财政年份: 1995
• 资助国家: 美国
• 起止时间: 1995-09-01 至 1999-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9522078&HistoricalAwards=false
• 关键词: Study; Thin; Film; Structures; Optoelectronic

9522078 Tamir The proposed work is a fundamental investigation into the electromagnetics phenomenology of planar thin-film configurations which serve as building blocks in a wide variety of optoelectronic devices. Both analytical and computational tools will be used, but modal methods combined with network and leaky-wave concepts will be emphasized because of their proven effectiveness in solving microwave problems that are similar to those in the area of planar optics. Interface and junction discontinuities exhibited by thin- film geometries will be explored in order to accurately assess effects that occur when components form complex composite structures. This approach will clarify a host of unresolved questions involving the operation of thin-film devices. In addition, it will serve to develop the systematic and accurate design criteria that are needed to implement existing and future optoelectronic components. The proposed research program is thus expected to advance the analytical state-of-the-art in planar optics to a level that is comparable to, or higher than, that already available in the microwave area. ***

9522078 Tamir提出的工作是对平面薄膜结构的电磁现象学的基础研究，它作为各种光电器件的组成部分。分析和计算工具都将被使用，但是结合网络和漏波概念的模态方法将被强调，因为它们在解决类似于平面光学领域的微波问题方面被证明是有效的。为了准确地评估组件形成复杂复合结构时所发生的影响，将探讨薄膜几何结构所表现出的界面和结不连续。这种方法将澄清涉及薄膜器件操作的许多尚未解决的问题。此外，它将有助于制定实施现有和未来光电元件所需的系统和准确的设计标准。因此，拟议的研究计划有望将平面光学的分析技术提高到与微波领域现有技术相当或更高的水平。＊＊＊