International Research Fellow Awards Program: Specimen Fabrication and Atom Probe Analysis of Metallic Multi-Layer Thin Film Structures

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9600327 Larson The International Research Fellow Awards Program enables U.S. scientists and engineers to conduct three to twentyfour months of research abroad. The program's awards provide opportunities for joint research, and the use of unique or complementary facilities, expertise and experimental conditions abroad. This award will support a twelve-month postdoctoral research visit by Dr. David J. Larson to work with Dr. Alfred Cerezo at the University of Oxford on a project entitled, "Specimen Fabrication and Atom Probe Analysis of Metallic Multilayer Thin Film Structures." The objective of this project is to correlate interfacial structure with magnetic properties in multilayer films. This will be done by 1) development of a specimen preparation technique for multilayer film (MLF) structures which allows atom probe analysis when the film normal is parallel to the tip axis and the films have not been prepared by sputtering or evaporating onto a highly curved sample and 2) atom probe field ion microscopy (APFIM) characterization of MLF structure for the purpose of correlating deposition and processing conditions with interfacial structure and ultimately, with magnetic properties. This correlation will allow optimization and reproducibility of the most important magnetic properties of MLFs for commercial applications. ***