Acquisition of Characterization Instrumentation for Advanced Materials Research

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9601640 Mao Thin film characterization instruments will be acquired by the Colorado School of Mines to complement existing thin film deposition facilities. The new instrumentation includes an ultraviolet-visible-near infrared spectrophotometer, a computer- controlled surface profilometer, an ellipsometer, and a Hall effect and thermopower measurement station. These instruments will support studies on polycrystalline compound semiconductor thin films for photovoltaic solar cells, transparent conductive oxide thin films, thin metal oxide barriers on photoconducting films for electrophotography applications, polymeric thin films, metallic oxide catalysts, and electrogalvanized sheet steels. %%% The new instruments will strengthen the thin films and coatings research efforts at the university. The research involves the participation of students and faculty from several departments through an interdisciplinary materials science program, and capitalizes on collaborations with the National Renewable Energy Laboratory. The new instrumentation will also benefit a new masters degree program that is oriented towards the microelectronics industry. ***