Chemical Analysis of Surfaces by Correlated TOF-SIMS and XPS

通过相关 TOF-SIMS 和 XPS 进行表面化学分析

• 批准号: 9631702
• 负责人: Julia Fulghum
• 金额: $ 5.97万
• 依托单位: Kent State University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1996
• 资助国家: 美国
• 起止时间: 1996-07-01 至 1998-06-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9631702&HistoricalAwards=false
• 关键词: Chemical; Analysis; Surfaces; Correlated; TOF

This project involves a Career Advancement Award to Julia E. Fulghum, Associate Professor of Chemistry at Kent State University. The PI is a recognized expert in X-ray Photoelectron Spectroscopy (XPS) and the purpose of this award is to enable her to spend a sabbatical leave at the National Renewable Energy Laboratory (NREL) in Denver, Colorado, to learn sample preparation and data analysis for time-of-flight secondary ion mass spectrometry (TOF-SIMS). Both XPS and TOF-SIMS are surface analysis techniques and the information they provide is complimentary. The PI will be able to expand her XPS technique development to encompass TOF-SIMS imaging with emphasis on organic and insulating samples. Part of the work at NREL will involve studies on photovoltaic materials development. In addition, the PI will be able to add TOF-SIMS capability to her on-going research work on the surface chemistry of materials. The long-term goal is to add TOF-SIMS instrumentation capability in her own laboratory. The project is supported by the Analytical and Surface Chemistry Program and the Special Projects Office in the Chemistry Division. This project will enable Professor Julia E. Fulghum to examine the surface chemistry of important technological materials such as liquid crystals and photovoltaics using two complementary techniques: X-ray photoelectron spectroscopy and time-of-flight-secondary ion mass spectrometry. Little work is available in the literature regarding such a comparison. Imaging is one aspect of the work and correlating information from both techniques will aid in understanding the artifacts and limitations of each of them. The results of the work will contribute to the development of solar cells for energy conversion and the technology of optical materials.

该项目向Julia E颁发了职业发展奖。富勒烯， 肯特州立大学化学副教授。 PI是一个 X射线光电子能谱（XPS）和 该奖项的目的是使她能够在大学度过一个公休假， 位于科罗拉多丹佛的国家可再生能源实验室（NREL）， 飞行时间二次离子的样品制备和数据分析 质谱（TOF-SIMS）。 XPS和TOF-SIMS都是表面分析 他们提供的技术和信息是免费的。 的PI 将能够扩展她的XPS技术开发， TOF-SIMS成像，重点是有机和绝缘样品。 部分 NREL的工作将涉及光伏材料的研究 发展 此外，PI将能够添加TOF-SIMS功能 她正在进行的材料表面化学的研究工作。 的 长期目标是在自己的系统中增加TOF-SIMS仪器能力 实验室 该项目得到了分析和表面 化学专业和化学专业特别项目办公室 师. 该项目将使Julia E.应检查 液体等重要技术材料的表面化学 使用两种互补技术的晶体和光子晶体学：X射线 光电子能谱和飞行时间二次离子质量 光谱法 在文献中几乎没有关于这种情况的工作。 一个比较。 成像是工作的一个方面， 来自这两种技术的信息将有助于理解工件 以及他们各自的局限性。 工作成果将有助于 用于能量转换的太阳能电池的发展， 光学材料技术