权益分类	功能权益	普通用户	{{item.name}}会员
{{category.name}}	{{benefitItem.name}}

MRI:Acquisition of X-ray for Photoelectron Spectrometer

MRI：采集 X 射线用于光电子能谱仪

基本信息

批准号：
0923510
负责人：
Julia Fulghum
金额：
$ 32.2万
依托单位：
University of New Mexico
依托单位国家：
美国
项目类别：
Standard Grant
财政年份：
2009
资助国家：
美国
起止时间：
2009-09-15 至 2012-08-31
项目状态：
已结题

来源：
https://www.nsf.gov/awardsearch/showAward?AWD_ID=0923510&HistoricalAwards=false
关键词：
MRI Acquisition ray Photoelectron Spectrometer

项目摘要

0923510FulghumThis proposal solicits funding to obtain an X-ray Photoelectron Spectrometer (XPS) for a Surface Characterization Facility associated with the Center for Emerging Energy Technologies (CEET) at the University of New Mexico (UNM). X-ray photoelectron spectroscopy (XPS) is one of the only surface-specific spectroscopic techniques that provides readily interpretable, quantitative chemical information. Advances in instrumentation in the last decade mean that high spatial and energy resolution data can be acquired for the analysis of heterogeneous samples, including biointerfaces, complex composite materials, nanostructured materials, ceramics, and catalysts. A spatial resolution of several microns is possible in XPS images, while angle-resolved XPS (ARXPS) can be used for non-destructive depth profiling of the top ~ 8 nm of the sample. The applicants propose to replace the current XPS, a 12 year-old Kratos AXIS Ultra with a Kratos AXIS Ultra DLD. The current UNM Surface Characterization facility is the only XPS facility at an educational institution in the state of New Mexico, and is available to faculty throughout the state. Replacing this instrument thus impacts a wide range of research projects. The PI has over twenty years of experience with XPS and the development of methods for the analysis of complex samples, and the current facility manager will be supervising the establishment of the new Surface Characterization Facility.

0923510 Fulghum该提案旨在为新墨西哥州大学新兴能源技术中心（CEET）的表面表征设施获得X射线光电子能谱仪（XPS）。X射线光电子能谱（XPS）是唯一的表面特异性光谱技术，提供易于解释，定量化学信息之一。在过去的十年中，仪器的进步意味着可以获得高空间和能量分辨率的数据，用于分析异质样品，包括生物界面，复杂的复合材料，纳米结构材料，陶瓷和催化剂。XPS图像的空间分辨率可能达到几微米，而角度分辨XPS（ARXPS）可用于样品顶部约8 nm的非破坏性深度分析。申请人建议用Kratos AXIS Ultra DLD替换现有的XPS，即使用12年的Kratos AXIS Ultra。目前UNM的表面表征设施是新墨西哥州教育机构中唯一的XPS设施，可供全州的教师使用。因此，更换这一工具会影响到广泛的研究项目。PI在XPS和复杂样品分析方法的开发方面拥有20多年的经验，现任设施经理将监督新表面表征设施的建立。