Built In Test Techniques for Mixed-Mode VLSI Systems

混合模式 VLSI 系统的内置测试技术

• 批准号: 9711099
• 负责人: Jaime Ramirez-Angulo
• 金额: $ 10.21万
• 依托单位: New Mexico State University
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 1997
• 资助国家: 美国
• 起止时间: 1997-09-01 至 2001-02-28
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9711099&HistoricalAwards=false
• 关键词: Built; Test; Techniques; Mixed; Mode

This research is on test methods for mixed signal and analog VLSI systems. Aspects being considered are: 1) design of high-speed dynamic current sensors for application in iDD pulse response test method, for mixed-mode, MOS and bipolar circuits; 2) development of high-speed static current sensors for utilization with the IDDQ test method; 3) verification of a dual to the IDDQ test scheme for analog circuits (denoted VDDQ testing). Approaches are: a) on-chip generation and comparison of VDDQ voltage references, and b) external measurement of VDDQ voltages using analog boundary scan test techniques to bring them out of chip in analog form using sample and hold circuits or in digital form after performing on-chip A /D conversion. Research activities designing, manufacturing and evaluating various integrated circuit prototypes of built-in dynamic and static current sensors and of VDDQ test circuitry.

本文研究混合信号和模拟VLSI系统的测试方法。 正在考虑的方面是：1）设计高速动态电流传感器，用于混合模式、MOS和双极电路的iDD脉冲响应测试方法; 2）开发高速静态电流传感器，用于IDDQ测试方法; 3）验证模拟电路的双重IDDQ测试方案（表示为VDDQ测试）。方法是：a）VDDQ电压基准的片上生成和比较，以及B）使用模拟边界扫描测试技术对VDDQ电压进行外部测量，以使用采样和保持电路将它们以模拟形式或在执行片上A /D转换之后以数字形式带出片外。设计、制造和评估内置动态和静态电流传感器以及VDDQ测试电路的各种集成电路原型。