Built In Test Techniques for Mixed-Mode VLSI Systems

本研究系针对混合讯号及类比积体电路系统之测试方法。 正在考虑的方面是：1）设计高速动态电流传感器，用于混合模式、MOS和双极电路的iDD脉冲响应测试方法; 2）开发高速静态电流传感器，用于IDDQ测试方法; 3）验证模拟电路的双重IDDQ测试方案（表示为VDDQ测试）。方法是：a）VDDQ电压基准的片上生成和比较，以及B）使用模拟边界扫描测试技术对VDDQ电压进行外部测量，以使用采样和保持电路将它们以模拟形式或在执行片上A /D转换之后以数字形式带出片外。设计、制造和评估内置动态和静态电流传感器以及VDDQ测试电路的各种集成电路原型的研究活动。

This research is on test methods for mixed signal and analog VLSI systems. Aspects being considered are: 1) design of high-speed dynamic current sensors for application in iDD pulse response test method, for mixed-mode, MOS and bipolar circuits; 2) development of high-speed static current sensors for utilization with the IDDQ test method; 3) verification of a dual to the IDDQ test scheme for analog circuits (denoted VDDQ testing). Approaches are: a) on-chip generation and comparison of VDDQ voltage references, and b) external measurement of VDDQ voltages using analog boundary scan test techniques to bring them out of chip in analog form using sample and hold circuits or in digital form after performing on-chip A /D conversion. Research activities designing, manufacturing and evaluating various integrated circuit prototypes of built-in dynamic and static current sensors and of VDDQ test circuitry.