Built In Test Techniques for Mixed-Mode VLSI Systems

本文针对混合信号和模拟VLSI系统的测试方法进行了研究。正在考虑的方面包括：1)设计用于混合模式、MOS和双极电路的IDD脉冲响应测试方法的高速动态电流传感器；2)开发用于IDDQ测试方法的高速静态电流传感器；3)验证模拟电路的IDDQ测试方案的对偶(表示为VDDQ测试)。方法是：a)VDDQ基准电压的片上产生和比较，以及b)使用模拟边界扫描测试技术从外部测量VDDQ电压，以便使用采样和保持电路将其以模拟形式带出芯片，或在执行片上A/D转换后以数字形式带出芯片。研究活动设计、制造和评估内置动态和静态电流传感器以及VDDQ测试电路的各种集成电路原型。

This research is on test methods for mixed signal and analog VLSI systems. Aspects being considered are: 1) design of high-speed dynamic current sensors for application in iDD pulse response test method, for mixed-mode, MOS and bipolar circuits; 2) development of high-speed static current sensors for utilization with the IDDQ test method; 3) verification of a dual to the IDDQ test scheme for analog circuits (denoted VDDQ testing). Approaches are: a) on-chip generation and comparison of VDDQ voltage references, and b) external measurement of VDDQ voltages using analog boundary scan test techniques to bring them out of chip in analog form using sample and hold circuits or in digital form after performing on-chip A /D conversion. Research activities designing, manufacturing and evaluating various integrated circuit prototypes of built-in dynamic and static current sensors and of VDDQ test circuitry.