Near-Field Scanning Optical Microscopy Studies of Luminescent Polymer/Metal Interfaces

发光聚合物/金属界面的近场扫描光学显微镜研究

• 批准号: 9800484
• 负责人: David Vanden Bout
• 金额: $ 4万
• 依托单位: University of Texas at Austin
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1998
• 资助国家: 美国
• 起止时间: 1998-01-15 至 1999-06-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9800484&HistoricalAwards=false
• 关键词: Near; Field; Scanning; Optical; Microscopy

This starter grant award of the Chemistry Division to the University of Texas at Austin supports the research of Professor David A. Vanden Bout. The theme of the research is the effects of interfacial chemistry and material heterogeneities on electronic and optical properties of luminescent conjugated polymers at metal interfaces. Near-field scanning optical microscopy (NSOM) combined with time-resolved spectroscopy will be used to probe polymer/metals interfaces directly. The NSOM will be coupled with ultrafast laser spectroscopy to include time-resolved measurements of the optical properties. Properties of particular interest include the migration and trapping of energy and fundamental excitations as well as localized photochemistry. Although inexpensive and reliable organic electronic devices have existed for years, poor durability and short lifetimes have limited the success of these devices. By probing the small region of polymer/metal interfaces directly, these studies will yield new insight into the workings and failures of organic devices such as polymer light-emitting diodes.

化学系的这一启动补助金授予了 德克萨斯大学奥斯汀分校支持大卫教授的研究。范登·布特 研究的主题是界面化学的影响， 材料非均匀性对电子和光学性质的影响 发光共轭聚合物在金属界面。 近场扫描 光学显微镜（NSOM）结合时间分辨光谱将 可用于直接探测聚合物/金属界面。 NSOM将在 结合超快激光光谱学， 光学性质的测量。 特殊的属性 兴趣包括迁移和捕获的能量和基本的 激发以及局部光化学。 尽管已经存在廉价且可靠的有机电子器件， 多年来，耐久性差和寿命短限制了成功 这些设备。 通过探测聚合物/金属的小区域， 直接接口，这些研究将产生新的见解 有机器件如聚合物发光器件的工作和故障 二极管。