Soft X-Ray Spectroscopy Using Synchrotron Radiation

9801804考尔科特这个项目由一个重点研究小组进行，来自三所大学的六名科学家：田纳西州的T.A.卡尔科特；杜兰的D.L.埃德勒；路易斯安那州的A.Moewes和三个国家实验室；国家标准和技术研究所的E.L.雪莉；R.C.佩雷拉，劳伦斯·伯克利实验室；L.J.特米内洛。劳伦斯·利弗莫尔国家实验室将利用软X射线荧光(SXF)光谱、软X射线吸收(SXA)光谱和软X射线光电发射(SXPS)光谱技术，通过同步加速器源继续进行他们在软X射线光谱方面的长期合作研究。将有三个领域进行研究：1)SXF和SXA将用于研究含有4d、5d和4f元素的化合物；2)结合主要理论的新实验将针对阈值附近激发的SXF光谱进行研究，这必须被描述为共振非弹性X射线散射过程；以及3)SX光谱将被用作深度探针，用于研究体性质、埋藏结构和界面，并探索驻波图案在X射线反射多层膜中的应用。通过这些研究获得的认识关系到高温超导、巨磁电阻、压电、电致伸缩和磁致伸缩效应等问题，也关系到基质隔离纳米粒子的电学性质、界面性质和多层体系中界面隔离的杂质。这项研究将使用劳伦斯伯克利国家实验室的先进光源和路易斯安那州立大学的CAMD光源。由来自三所大学的六名科学家组成的重点研究小组：田纳西州的T.A.卡尔科特；杜兰的D.L.E德雷尔；路易斯安那州的A.Moewes和三个国家实验室；美国国家标准与技术研究所的E.L.雪莉；R.C.佩雷拉，劳伦斯·伯克利实验室；L.J.特米内洛。劳伦斯·利弗莫尔国家实验室将继续他们在软X射线光谱方面的长期合作研究，利用同步辐射光源，使用软X射线荧光光谱、软X射线吸收光谱和软X射线光电子能谱技术。调查的目标领域包括对含有元素的化合物的研究，这些元素是这些材料的特征成分，目前处于调查的前沿，以确定其在先进技术设备中的适用性，研究块体性质、埋藏结构和界面，以及探索在X射线反射多层膜中使用驻波图案。通过这些研究获得的认识关系到高温超导、巨磁电阻、压电、电致伸缩和磁致伸缩效应等问题，也关系到基质隔离纳米粒子的电学性质，以及多层体系中界面的性质和界面上的杂质隔离。这项研究将使用劳伦斯伯克利国家实验室的先进光源和路易斯安那州立大学的CAMD光源。除了指定的主要研究人员外，还有大量来自其他大学和研究机构的合作者，包括本科生和研究生以及博士后研究助理。这些合作确保了研究结果广泛传播到工业、学术界和国家实验室的其他研究小组，并有助于培养下一代研究科学家。***

9801804 Callcott This project pursued by a Focused Research Group, six scientists from three universities T.A. Calcott, Tennessee; D.L. Ederer, Tulane; A. Moewes, Louisiana State and three national laboratories E.L. Shirley, National Institute of Standards and Technology; R.C. Perera, Lawrence Berkeley Laboratory; L.J. Terminello. Lawrence Livermore National Laboratory , will continue their long standing collaborative research in soft x-ray spectroscopy by means of synchrotron sources using the techniques of soft x-ray fluorescence (SXF) spectroscopy, soft x-ray absorption (SXA) spectroscopy, and soft x-ray photoemission (SXPS) spectroscopy. Three areas are targeted for investigation: 1) SXF and SXA will be used to study compounds containing 4d, 5d, and 4f elements; 2) New experiments combined with a major emphasis on theory will be directed to the study of SXF spectra excited near threshold which must be described as a resonant inelastic x-ray scattering process; and 3) SX spectroscopies will be used as deep probes for the study of bulk properties, and buried structures and interfaces, and to explore the use of standing wave patterns in x-ray reflecting multilayers. The understandings obtained through these studies have bearing on the problems of high temperature superconductivity, giant magnetoresistance, and piezoelectric, electrostrictive and magnetostrictive effects, as well on the electronic properties of matrix isolated nano-particles, the properties of interfaces and impurities isolated at interfaces in multilayer systems. The facilities of the Advanced Light Source at the Lawrence Berkeley National Laboratory and the CAMD light source at Louisiana State University will be used in this research. %%% The Focused Research Group composed of six scientists from three universities T.A. Calcott, Tennessee; D.L. E derer, Tulane; A. Moewes, Louisiana State and three national laboratories E.L. Shirley, National Institute of Standards and Technology; R.C. Perera, Lawrence Berkeley Laboratory; L.J. Terminello. Lawrence Livermore National Laboratory will continue their long standing collaborative research in soft x-ray spectroscopy by means of synchrotron light sources using the techniques of soft x-ray fluorescence spectroscopy, soft x-ray absorption spectroscopy, and soft x-ray photoemission spectroscopy. Among the areas targeted for investigation are the study of compounds containing elements which are characteristic components of those materials that are currently at the forefront of investigations to ascertain their suitability in advanced technological devices, the study of bulk properties, buried structures and interfaces, and the exploration of the use of standing wave patterns in x- ray reflecting multilayers. The understandings obtained through these studies have bearing on the problems of high temperature superconductivity, giant magnetoresistance, and piezoelectric, electrostrictive and magnetostrictive effects, as well as on the electronic properties of matrix isolated nano-particles, and the properties of interfaces and impurities isolated at interfaces in multilayer systems. The facilities of the Advanced Light Source at the Lawrence Berkeley National Laboratory and the CAMD light source at Louisiana State University will be used in this research. In addition to the named principal investigators there is a large number of collaborators from other universities and research institutions, including undergraduate and graduate students and post doctoral research associates. These collaborations insure the wide dispersal of the results of the research to other research groups in industry, academe, and national laboratories, and serve to train the next generation of research scientists. ***