Soft X-ray Emission Spectroscopy Using Synchrotron Light Excitation

他们将测量由布鲁克海文国家实验室国家同步加速器光源低能量存储环发出的光激发的软X射线发射光谱。测量是用最近在NSF和参与研究的三个机构的支持下建造的光谱仪设施进行的(Univ.田纳西州国家标准局和橡树岭国家实验室)。光谱仪设备的独特之处在于其使用光子激发、宽能量范围(100-1000 eV光子)、高分辨率和卓越的测量效率。X射线发射光谱学可以详细研究元素的电子状态，化合物和合金的单个成分，以及嵌入固体系统中的杂质、团簇和次要成分。它比电子光谱仪的表面灵敏度低，当与光子激发相结合时，对于研究被电子激发破坏的易碎化合物是有用的。计划进行几个实验：轻金属合金、硼合金和化合物、高T_c超导合金、半导体化合物、稀有气体固体、嵌入各种固体基质中的团簇和多层体系的研究。

They will measure soft x-ray emission spectra excited by light from the low energy storage ring of the National Synchrotron Light Source at Brookhaven National Laboratory. The measurements are made with a spectrometer facility recently constructed with support from NSF, and the three institutions participating in the research (Univ. of Tenn., National Bureau of Standards, and the Oak Ridge National Laboratory). The spectrometer facility is unique in its use of photon excitation, its wide energy range (100-1000 eV photons), high resolution, and superior measuring efficiency. X-ray emission spectroscopy permits the detailed study of the electronic states of elements, of individual components of compounds and alloys, and of impurities, clusters and minor contituents imbedded in solid systems. It is less surface sensitive than electron spectroscopies, and when combined with photon excitation, is useful for the study of fragile compounds that are damaged by electron excitation. Several experiments are planned: studies of light metal alloys, Boron alloys and compounds, high Tc superconducting alloys, semiconducting compounds, rare gas solids, clusters imbedded in various solid matrices, and multilayer systems.