SBIR Phase I: Positron Auger Spectroscopy for Advanced Materials Analysis

SBIR 第一阶段：用于先进材料分析的正电子俄歇光谱

• 批准号: 9861318
• 负责人: David Harris
• 金额: $ 9.97万
• 依托单位: Charles Evans & Associates
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 1999
• 资助国家: 美国
• 起止时间: 1999-01-01 至 1999-06-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=9861318&HistoricalAwards=false
• 关键词: SBIR; Phase; Positron; Auger; Spectroscopy

9861318 This Phase I research will determine the feasibility of developing positron-electron annihilation processes into an innovative generation of Auger electron spectroscopy (AES) instruments. It is well known that collisions of low energy positrons with solid surfaces produces copious quantities of secondary and Auger electrons after positron annihilation with a core level electron in the solid. The intrinsic signal-to-noise (S/N) of this positron AES (PAES) is several orders of magnitude higher than conventional electron beam AES (EAES) and therein lies the attraction of PAES. We will build an experimental positron source or beam using 22Na as the positron emitter and various ion optical elements to transport this beam to surfaces of samples placed on commercial AES instruments. This feasibility research will thus directly compare PAES and EAES for identical samples in order to better assess the possible sensitivity improvements of PAES. This research will be a collaboration between Charles Evans Associates and Professor David Golden at the University of North Texas. The successful development of PAES will introduce a more sensitive surface analysis technique for chemical analysis of the top atomic layers of high technology materials. This research could also lead to the development of positron sources to convert conventional AES instruments into PAES tools.

9861318第一阶段的研究将确定将正电子湮灭过程发展成为创新一代俄歇电子能谱（AES）仪器的可行性。众所周知，低能量正电子与固体表面的碰撞在正电子与固体中的核能级电子湮灭后会产生大量的二次电子和俄歇电子。该正电子AES （PAES）的本征信噪比（S/N）比传统电子束AES （EAES）高几个数量级，这就是PAES的吸引力所在。我们将建立一个实验正电子源或束，使用22Na作为正电子发射器和各种离子光学元件将该束传输到放置在商用AES仪器上的样品表面。因此，本可行性研究将直接比较相同样品的PAES和EAES，以便更好地评估PAES可能提高的灵敏度。这项研究将由Charles Evans Associates和北德克萨斯大学的David Golden教授合作进行。PAES的成功开发将为高技术材料顶层原子层的化学分析提供一种更灵敏的表面分析技术。这项研究也可能导致正电子源的发展，将传统的AES仪器转换为PAES工具。