SBIR Phase I: Innovative Assessment of Induced Subsurface Stress in Single Crystal Materials Using Photon Induced Positron Annihilation (PIPA)

这个小企业创新研究（SBIR）第一阶段项目将进行旨在表征单晶和复杂多晶材料表面处理引起的地下残余应力的研究。光子诱导正电子湮灭（PIPA）将用于量化单晶材料和工作部件在高应力/高温环境下的亚表面残余应力。PIPA作为一种非破坏性材料表征技术，有潜力提供原子水平上的可量化经验数据，用于导致失效的关键部件应用的先进金属/金属间合金的晶格结构变化。在商业上，政府和工业每年花费数十亿美元用于部件和系统的维护和修理。许多维护程序都是基于保守的工程模型，而不是实际的经验数据，这导致了组件的早期更换，维护周期的加快，以及对故障机制的被动与主动的方法。PIPA提供了关于材料特性的实时经验信息，重新定义了保守的预测模型，并为决策者提供了基于材料损坏的实际评估来评估材料和部件的扩展或更换考虑的硬数据。

This Small Business Innovation Research (SBIR) Phase I project will perform research aimed atcharacterizing subsurface residual stresses induced through surface treatments in singlecrystal and complex polycrystalline materials. Photon Induced Positron Annihilation(PIPA) will be used to quantify subsurface residual stress in single crystal materials and operational components subjected to high stress/high temperature environments. PIPA as a nondestructive material characterization technology has the potential to provide quantifiable, empirical data on atomic level, lattice structure changes in advanced metallic/intermetallic alloys used for critical component applications that result in failure. Commercially, government and industry spend billions of dollars each year in the maintenance and repair of components and systems. Many of the maintenance procedures are based upon conservative engineering models instead of actual empirical data, leading to early replacement of components, accelerated maintenance cycles, and a reactive versus proactive approach to failure mechanisms. PIPA provides real-time, empirical information on material characterization, redefining conservative prediction models and supplying decision makers with the hard data to evaluate materials and components for extension or replacement considerations, based upon the actual assessment of material damage.