MRI: Acquisition of a FEG Transmission Electron Microscope for Nanostructured Materials and Earth Sciences Research

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Abstract - CTS-9871292 - Datye - Papiki - Xu Professors Abhaya K. Datye and James J. Papiki, and Dr. Huifang Xu, of the U. of New Mexico, will acquire a JEOL Model 2010 200 keV field emission gun combination transmission electron microscope and scanning transmission electron microscope (FEG-TEM-STEM) for nanostructured materials and earth sciences research. The new FEG-TEM-STEM will yield elemental analysis (by energy-dispersion and electron-energy loss spectroscopies) and novel imaging (by Z-contrast and electron holography) of materials at the sub-nanometer scale. Such resolution is essential for advancing the knowledge of nanostructured materials, their chemistry and physics, and their role in earth sciences and a multiplicity of modern technologies. The FEG-TEM-STEM will be the top-of-the-line instrument in an existing microscopy laboratory which includes an electron microprobe, a scanning electron microscope, an X-ray diffractometer, and a suite of sample preparation equipment. The laboratory will provide research access to multiple investigators at U. N. M., and to faculty of N. M. Highlands U. and N. M. Inst. Mining and Technology, involving the departments of Chemical and Nuclear Engineering, Electrical and Computer Engineering, Earth and Planetary Sciences, and Biology. It will also provide hands-on microscopy instruction to students.