Acquisition of a Low-Energy Electron Microscope

购置低能电子显微镜

• 批准号: 0079416
• 负责人: Robert Suter
• 金额: $ 35.84万
• 依托单位: Carnegie-Mellon University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2000
• 资助国家: 美国
• 起止时间: 2000-08-15 至 2001-12-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0079416&HistoricalAwards=false
• 关键词: Acquisition; Low; Energy; Electron; Microscope

0079416HanonLow-Energy Electron Microscopy (LEEM) is used to generate real-time images of surfaces with a lateral resolution of better than 10 nanometer. Surfaces can be imaged at arbitrarily high temperatures, and during growth. Contrast in LEEM arises because of differences in electron reflectivity at the surface, which reflect variations in the structural, chemical and magnetic properties of the surface. This award will help establish a LEEM facility at Carnegie Mellon University for use by an interdisciplinary group of researchers spanning four University departments. Proposed research projects include investigations of phase transitions at surfaces, two-dimensional coarsening and growth, step and phase boundary fluctuations, GaN growth, wetting of organic films, surface magnetism, growth at chiral surfaces, and texture development in thin film growth.Low-Energy Electron Microscopy (LEEM) is used to generate real-time images of surfaces with a lateral resolution of better than ten nanomters, during growth, and at arbitrarily high temperatures. These unique features allow growth at surfaces to be studied in unprecedented detail. A LEEM facility will be established at Carnegie Mellon University for use by an interdisciplinary group of researchers. LEEM will be applied to a wide range of growth problems, from fundamental investigations of the chemistry and physics of surfaces, to process optimization in the development of new magnetic media.

0079416 Hanon低能电子显微镜（LEEM）用于生成横向分辨率优于10纳米的表面实时图像。 表面可以在任意高温下和生长过程中成像。 LEEM中的对比度是由于表面处的电子反射率的差异而产生的，这反映了表面的结构、化学和磁性的变化。该奖项将有助于在卡内基梅隆大学建立一个LEEM设施，供跨四个大学部门的跨学科研究人员使用。建议的研究项目包括表面相变、二维粗化和生长、台阶和相边界波动、GaN生长、有机膜润湿、表面磁性、手性表面生长和薄膜生长中的织构发展的研究。低能电子显微镜（LEEM）用于生成横向分辨率优于10纳米的表面实时图像，在生长期间，在任意的高温下。 这些独特的功能允许在表面生长进行研究，在前所未有的细节。 将在卡内基梅隆大学建立一个LEEM设施，供一个跨学科研究小组使用。 LEEM将应用于广泛的生长问题，从表面化学和物理的基础研究，到新磁介质开发过程的优化。