Development of a Technique to Maximize the Useful Yield in Secondary Ion Mass Spectrometry (SIMS) Analyses of Minerals and Glasses

0091796 Hervig该奖项支持旨在确定地质材料二次离子质谱（西姆斯）研究的最佳条件的研究。这一目标将通过1）测量溅射产率来实现（原子被去除/初级离子撞击样品）的硅酸盐玻璃的O2-，O-，K+，和Cs+在冲击能量范围为~22.5至~5 keV和2）测量有用的产率（离子检测/原子溅射）的硅酸盐玻璃中的~60种微量元素与不同的主要物种和冲击能量，还将研究其他样品（分别注入铂族元素和氢的硫化物和玻璃）。这些基本数据将被改写成一个通用的“最佳分析条件手册”，并将允许研究人员应用西姆斯的问题，在微量元素和同位素比微量分析，以获得最高的灵敏度在样品消耗方面的最低成本。***

0091796HervigThis award supports research with the goal of determining the optimum conditions for secondary ion mass spectrometry (SIMS) studies of geological materials. This goal will be accomplished by 1) measuring the sputter yield (atoms removed/primary ions striking the sample) of silicate glass bombarded by primary ion beams of O2-, O-, K+, and Cs+ at impact energies ranging from ~22.5 to ~5 keV and 2) measuring the useful yields (ions detected/atoms sputtered) of ~60 trace elements in silicate glass with the different primary species and impact energies, Additional samples (sulfides and glasses implanted with platinum group elements and hydrogen, respectively) will also be studied. These fundamental data will be recast into a general "handbook of optimum analysis conditions" and will allow researchers applying SIMS to problems in trace element and isotope ratio microanalysis to get the highest sensitivity at the lowest cost in terms of sample consumption. ***