Development of microbeam Analytical Capabilities for the Secondary Ion Mass Spectrometer

亚利桑那州立大学的次级离子质谱仪（SIMS或离子微探针）将被改进，以提高主离子束的性能（更小的直径，因此，更好的分析空间分辨率）。还将实现更好的真空，从而降低检测限，特别是对轻挥发性元素。仪器修改将由首席研究员和同事在内部设计、制造和测试。改进后的ASU离子探针将提供给校内和校外的研究人员，并将主要用于地球科学项目，以确定空间分辨率在几微米量级的地质和陨石样品的同位素和微量元素组成。＊＊＊

9305201 Hervig The secondary ion mass spectrometer (SIMS or ion microprobe) at Arizona State University will be modified to improve the performance of the primary ion beam (smaller diameter and, hence, better analytical spatial resolution). A better vacuum will also be achieved, resulting in a lowering of detection limits, especially for light volatile elements. The instrument modifications will be designed, built and tested in-house by the Principal Investigator and colleagues. The improved ASU ion microprobe will be available to on-campus and off-campus researchers, and will be used primarily in earth sciences projects to determine isotope and trace element compositions of geological and meteorite samples with a spatial resolution on the order of several micrometers. ***